Agilent Technologies 8504B - Page 258

FINAL TRIM SIZE : 7.5 in x 9.0 in
Specications
and
Regulatory
Information
Characteristics
Measurement
Noise
Floor
The
instrument measurement
noise oor
is
nearly
independent
of
mirror
position
when using
the 1300
nm
source
.
Noise
oor
with
1300
nm
source.
F
or
the
1550
nm
source
with
dispersion
correction
enabled, the
measurement
noise
oor
depends
on
the
mirror
position.
The
noise
oor
at
a mirror
position
of
400
mm is
approximately 5
dB
higher
than
at
a
mirror
position
of
0
mm.
The
noise oor
for all
mirror
positions
can
be
substantially
lowered
by
narrowing
the
measurement
span.
Noise oor
with 1550
nm source.
6-15
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