Agilent Technologies E8362B User Manual

Index-18 Service Guide E8364-90026
Index
failure of, 3-27
getting ready
, 3-4
interpreting results, 3-28
performing
, 3-23
procedure
, 3-25
test setup, 3-25
what it verifies
, 3-20
system motherboard
illustrated, 6-13, 6-17
operation, 5-31
part number
, 6-12, 6-16
removal and replacement
illustrated
, 7-27
procedure
, 7-26
troubleshooting
, 4-12
T
test
calibration coefficients, 3-36
dynamic accuracy
, 3-38
frequency accuracy
, 3-33
noise floor, 3-35
performance
frequency accuracy
, 3-33
source maximum power
output
, 3-32
source power accuracy
, 3-31
test port maximum power
output
, 3-32
test port power accuracy
, 3-31
receiver compression, 3-34
source power linearity
, 3-32
system crosstalk
, 3-37
test port crosstalk, 3-37
test port output power linearity
,
3-32
trace noise
, 3-33
test equipment
required for service, 2-9
required for servicing
, 2-9
test nodes
on A10 frequency reference,
4-37
on A11 phase lock board
, 4-37
on A12 source 20
, 4-36
on A16 test set motherboard
,
4-38, 4-39, 4-40
on A8 fractional-N synthesizer
board
, 4-38
on A9 fractional-N synthesizer
board
, 4-40
test port
cable checks
connector repeatability
failure
, 3-19
coupler nut
illustrated
, 6-69, 6-71
part number
, 6-68, 6-70
cross talk test
, 3-37
dynamic accuracy test, 3-38
maximum output power test
,
3-32
noise floor test, 3-35
output power accuracy test
, 3-31
output power linearity test
, 3-32
test port 1 coupler
illustrated, 6-21
operation
, 5-17
part number
, 6-20
removal and replacement
illustrated
, 7-49
procedure
, 7-48
troubleshooting, 4-50
test port 2 coupler
illustrated, 6-21
operation
, 5-17
part number, 6-20
removal and replacement
illustrated
, 7-49
procedure, 7-48
troubleshooting
, 4-50
test port cable
checks, 3-11
accessories used in, 3-13
connector repeatability
, 3-18
insertion loss
, 3-15
insertion loss failure, 3-15
magnitude and phase
stability
, 3-16
magnitude and phase stability
failure
, 3-17
performing
, 3-13
return loss, 3-14
return loss failure
, 3-14
TEST SET DRIVERS connectors
operation, 5-26
TEST SET I/O
connector
pin assignments
, 5-13
rear panel
, 5-12
test set motherboard
illustrated, 6-21
operation
, 5-12
part number
, 6-20
removal and replacement
illustrated
, 7-31
procedure
, 7-30
test nodes
, 4-38, 4-39, 4-40
troubleshooting
, 4-38, 4-39,
4-40
test setup
system verification, 3-25
tests
adjustments, 3-40
frequency offset group (option
080)
, 4-54
N2721A software, 3-31
performance
, 3-7, 3-31
serial bus
, 4-35
dialog box, 4-36
performing
, 4-35
source group
, 4-41
time domain, Option 010 , 2-3
tools
required for servicing, 2-11
service, part numbers
, 6-80
top assembly, Option 080
replaceable cables
illustrated
, 6-19
part numbers
, 6-18
replaceable parts
illustrated
, 6-17
part numbers
, 6-16
top assembly, without Option 080
replaceable parts
part numbers, 6-12
top assembly, without Option 080
replaceable cables
illustrated
, 6-15
part numbers, 6-14
replaceable parts
illustrated
, 6-13
touch-up
paint
part numbers
, 6-82
trace
troubleshooting all, 4-31, 4-33
trace A
troubleshooting, 4-31, 4-34
trace B
troubleshooting, 4-31, 4-34
trace noise
test, 3-33
trace R1
troubleshooting, 4-31, 4-34
trace R2
troubleshooting, 4-31, 4-34
traceability
measurement, 3-22
path
, 3-22
transfer switches
description of, 2-5
illustrated
, 6-45, 6-47, 6-49,
6-51, 6-53, 6-55, 6-57, 6-59,
6-61, 6-63
operation
, 5-24
part number
, 6-44, 6-48, 6-52,
6-56, 6-60
removal and replacement
illustrated
, 7-71
procedure
, 7-70
transmission tracking
cause of failure, 8-13

Agilent Technologies E8362B Specifications

General

Brand	Agilent Technologies
Model	E8362B
Category	Measuring Instruments
Language	English