6 Memory
LeadingTime: Pulse leading edge transition time
TrailingTime: Pulse trailing edge transition time
TotalRetentionTime: Time to continue the test. 10 to 10000 seconds.
[Extended Test Parameters]
IgLimit: Gate current compliance
HoldTime: Hold time
DelayTime: Delay time
PgAdd: GPIB address of pulse generator
BaseValue: Write pulse base value
NoOfPulse: Number of output pulses for the write operation
[Test Output: X-Y Graph]
X axis: Time TimeList (LOG)
Y1 axis: Threshold voltage VthList (LINEAR)
[Test Setup Details]
See NandFlash2 IV-Write-IV.
Agilent EasyEXPERT Application Library Reference, Edition 8
6-22
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