6 Memory
CheckNoOfTimes: Number of Vth measurement operation
[Extended Test Parameters]
Vs: Source voltage
Vsubs: Substrate voltage
IgLimit: Gate current compliance
HoldTime: Hold time
DelayTime: Delay time
BaseValue: Pulse base value
NoOfPulse: Number of output pulses for the erase operation
DrainMinRng: Minimum range of drain current measurement
[Measurement Parameters]
Drain current Idrain
[Analysis Function]
Vth@Id=@L1X (X intercept of Line1)
[X-Y Plot]
X axis: Gate voltage Vgate (LINEAR)
Y1 axis: Drain current Idrain (LINEAR)
Y2 axis: Drain current Idrain (LOG)
[List Display]
Gate voltage Vgate
Drain voltage Vdrain
Drain current Idrain
[Test Contents: Auto Analysis]
Line1: Vertical line for Y1 at Idrain=Id@Vth
[Test Output: X-Y Graph]
X axis: Accumulated erasing pulse width EraseTimeList (LOG)
Y1 axis: Threshold voltage VthList (LINEAR)
[Test Output: List Display]
Accumulated erasing pulse width EraseTimeList
Threshold voltage VthList
Agilent EasyEXPERT Application Library Reference, Edition 8
6-68
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