8 NanoTech
8.8 CNT R-I Kelvin 2SMU: CNT R-I characteristics, Kelvin connection
(A.01.20)
[Supported Analyzer]
B1500A, 4155B, 4155C, 4156B, 4156C
[Description]
Measures the electric resistance of a CNT 2-terminal device and plots R-I (resistance vs current)
characteristics. This test is designed to apply a current between terminals of devices, measure a voltage and
calculate resistance. Kelvin connection is used for connecting SMU to a device.
[Device Under Test]
Carbon Nano Tube FET, 2 terminals
[Device Parameters]
L: CNT length
D: CNT diameter
Temp: Temperature
[Test Parameters]
IntegTime: Integration time
Port1: SMU connected to resistor, primary sweep current output
I1Start: Sweep output start current
I1Stop: Sweep output stop current
I1Step: Sweep output step current
V1Limit: Port1 voltage compliance
Port2: SMU connected to resistor, constant voltage output
[Extended Test Parameters]
HoldTime: Hold time
DelayTime: Delay time
V2: Port2 voltage
[Measurement Parameters]
Vport1: Port1 voltage
[User Function]
Circular constant PI=3.141592653589
Resistor terminal voltage DeltaV=Vport1-Vport2
Resistance R=DeltaV/Iport1
Sheet resistance Rsheet=R*((PI*D)/L)
[X-Y Plot]
X axis: Current Iport1 (LINEAR)
Y1 axis: Resistance R (LINEAR)
Y2 axis: Measured voltage DeltaV (LINEAR)
[List Display]
Iport1: Input current
R: Resistance value
DeltaV: Resistor terminal voltage
Rsheet: Sheet resistance
Agilent EasyEXPERT Application Library Reference, Edition 8
8-13
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