Agilent Technologies EasyEXPERT

11 Reliability
[Test Parameters for IvSweep_hfe]
MeasCollector: SMU connected to Collector terminal, constant voltage output
MeasBase: SMU connected to Base terminal, voltage output
MeasEmitter: SMU connected to Emitter terminal, primary sweep constant voltage output
MeasSubs: SMU connected to Substrate terminal, constant voltage output
VbStart: Sweep start voltage for Base terminal
VbStop: Sweep stop voltage for Base terminal
VbStep: Sweep step voltage for Base terminal
Ic@hfe: Collector current determining the hfe
Vc: Collector voltage
[Extended Test Parameters]
[Extended Test Parameters for Sampling_Stress]
VbStrs: Stress voltage for Base terminal
VcStrs: Stress voltage for Collector terminal
VsubsStrs: Stress voltage for Substrate terminal
IeStrsLimit: Emitter current compliance
[Extended Test Parameters for IvSweep_hfe]
IsubsLimit: Substrate current compliance
Ve: Emitter voltage
Vsubs: Substrate voltage
hfe_Min: Minimum hfe value for graph scale
hfe_Max: Maximum hfe value for graph scale
HoldTime: Hold time
DelayTime: Delay time
BaseMinRng1: Minimum range for base current measurement on device 1
BaseMinRng2: Minimum range for base current measurement on device 2
BaseMinRng3: Minimum range for base current measurement on device 3
CollectorMinRng1: Minimum range for collector current measurement on device 1
CollectorMinRng2: Minimum range for collector current measurement on device 2
CollectorMinRng3: Minimum range for collector current measurement on device 3
[User Function]
[User Function for Sampling_Stress]
Maximum elapsed time value MaxTime=max(Time)
Stress time StressTime=AccTime+Time
[User Function for IvSweep_hfe]
Current amplification factor hfe=Icollector/Ibase
[Analysis Function]
[Analysis Function for IvSweep_hfe]
Ib@Ic=@L1X (X intercept of Line1)
hfe@Ic=@L2Y3 (X intercept of Line2)
[Auto Analysis]
[Auto Analysis for IvSweep_hfe]
Line1: Horizontal line for Y1 at Icollector=Ic@hfe
Line2: Horizontal line for Y3 at Icollector=Ic@hfe
[Test Output: X-Y Graph]
X axis: Accumulated stress time TimeList (LOG)
Y1 axis: Collector current for device 1 Dev1_IcList (LINEAR)
Y2 axis: Collector current for device 2 Dev2_IcList (LINEAR)
Agilent EasyEXPERT Application Library Reference, Edition 8
11-4