11 Reliability
Y3 axis: Collector current for device 3 Dev3_IcList (LINEAR)
Y4 axis: Y3 accumulation data at Icollector=Ic@hfe for device 1 Dev1_hfe@IcList (LINEAR)
Y5 axis: Y3 accumulation data at Icollector=Ic@hfe for device 2 Dev2_hfe@IcList (LINEAR)
Y6 axis: Y3 accumulation data at Icollector=Ic@hfe for device 3 Dev3_hfe@IcList (LINEAR)
[Test Output: List Display]
TimeList: Accumulated stress time
Dev1_IcList: Collector current for device 1
Dev2_IcList: Collector current for device 2
Dev3_IcList: Collector current for device 3
Dev1_hfe@IcList: Y3 accumulation data at Icollector=Ic@hfe for device 1
Dev2_hfe@IcList: Y3 accumulation data at Icollector=Ic@hfe for device 2
Dev3_hfe@IcList: Y3 accumulation data at Icollector=Ic@hfe for device 3
Dev1_Ib@IcList: Y1 accumulation data at Icollector=Ic@hfe for device 1
Dev2_Ib@IcList: Y1 accumulation data at Icollector=Ic@hfe for device 2
Dev3_Ib@IcList: Y1 accumulation data at Icollector=Ic@hfe for device 3
Agilent EasyEXPERT Application Library Reference, Edition 8
11-5
To Next Page
Loading...