In This Document
Agilent EasyEXPERT software contains the application library which supports the
characteristic measurements of CMOS devices, TFT, BJT, diode, resistor, capacitor,
varactor, memory, nanotechnology devices such as CNT FET, and so on. The application
library includes more than one hundred test definitions. And they are classified into the
following categories.
•BJT
•CMOS
•Discrete
• GenericTest
•MCSMU_IV
•Memory
• MixedSignal
• NanoTech
•Organic
• PwrDevice
• Reliability
•Sample
•Solar Cell
• SPGU_PLSDIV
• Structure
•TFT
• Utility
•WGFMU
• WGFMU Utility
•WGFMU_IV
•GaN Diode
•GaN FET
•IGBT
• Interconnection
•MISCAP
•PowerBJT
• PowerDiode
• PowerMOSFET
•PMIC
•SiC
To Next Page
