Agilent Technologies EasyEXPERT

11 Reliability
[List Display]
Elapsed time Time
Substrate current Isubs
[Test Output: X-Y Graph]
X axis: Gate pulse base voltage VbaseList (LINEAR)
Y1 axis: Substrate current IcpList (LOG)
[Test Output: List Display]
Gate pulse base voltage VbaseList
Substrate current IcpList
[Test Output: Parameters]
Maximum substrate current IcpMax
Interface state density Nss
[Nss calculation]
Nss=IcpMax/q*PulsePeriod/Lg/Wg
Agilent EasyEXPERT Application Library Reference, Edition 8
11-41