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Agilent Technologies EasyEXPERT

Agilent Technologies EasyEXPERT
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11 Reliability
[List Display]
Stress time Time
Voltage between terminals of wiring device DeltaV
Resistance of wiring device R
[Test Output: X-Y Graph]
X axis: Accumulated stress time TimeList (LOG)
Y1 axis: Voltage between terminals of wiring device DeltaVList (LINEAR)
Y2 axis: Resistance of wiring device RList (LINEAR)
Y3 axis: Difference from initial resistance DeltaRList (LINEAR)
[Test Output: List Display]
Accumulated stress time TimeList
Voltage between terminals of wiring device DeltaVList
Resistance of wiring device RList
Difference from initial resistance DeltaRList
[Test Output: Parameters]
Time to failure FailureTime
Agilent EasyEXPERT Application Library Reference, Edition 8
11-44

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