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Agilent Technologies EasyEXPERT - Page 331

Agilent Technologies EasyEXPERT
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11 Reliability
[Test Output: X-Y Graph]
X axis: Accumulated stress time TimeList (LOG)
Y1 axis: Port1 voltage Vport1List (LINEAR)
Y2 axis: Resistance of wiring device RList (LINEAR)
Y3 axis: Difference from initial resistance DeltaRList (LINEAR)
[Test Output: List Display]
Accumulated stress time TimeList
Port1 voltage Vport1List
Resistance of wiring device RList
Difference from initial resistance DeltaRList
[Test Output: Parameters]
Time to failure FailureTime
Agilent EasyEXPERT Application Library Reference, Edition 8
11-47

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