Agilent Technologies EasyEXPERT - Page 351

11 Reliability
[Extended Test Parameters for IvSweep_ConstId]
HoldTime: Hold time
DelayTime: Delay time
Vs: Source terminal voltage
IgLimit: Gate current compliance
IdLimit: Drain current compliance
IsubsLimit: Substrate current compliance
DrainMinRng: Minimum range for drain current measurement
[Extended Test Parameters for IvSweep_gmmax]
HoldTime: Hold time
DelayTime: Delay time
Vs: Source terminal voltage
IgLimit: Gate current compliance
IdLimit: Drain current compliance
IsubsLimit: Substrate current compliance
Vth_Min: Minimum Vth value for graph scale
Vth_Max: Maximum Vth value for graph scale
gmMax_Min: Minimum gmMax value for graph scale
gmMax_Max: Maximum gmMax value for graph scale
DrainMinRng: Minimum range for drain current measurement
[Extended Test Parameters for Sampling_Ids]
Vs: Source terminal voltage
IgLimit: Gate current compliance
IdLimit: Drain current compliance
IsubsLimit: Substrate current compliance
DrainMinRng: Minimum range for drain current measurement
[User Function]
[User Function for Sampling_Stress]
Maximum elapsed time value MaxTime=max(Time)
Stress time StressTime=AccTime+Time
[User Function for IvSweep_ConstId]
Maximum drain current value IdMax=max(abs(Idrain)) (For initial measurement only)
[User Function for IvSweep_gmmax]
Maximum drain current value IdMax=max(abs(Idrain)) (For initial measurement only)
Transconductance gm=diff(Idrain,Vgate)
Maximum transconductance value gmMax=max(gm)
[Analysis Function]
[Analysis Function for IvSweep_ConstId]
Vth@Id=@L1X (X intercept of Line1)
[Analysis Function for IvSweep_gmmax]
Vth@Gm=@L1X (X intercept of Line1)
[Auto Analysis]
[Auto Analysis for IvSweep_ConstId]
Line1: Vertical line for Y1 at Idrain=Id@Vth
[Auto Analysis for IvSweep_gmmax]
Line1: Tangent line for Y1 at gm=gmMax
Agilent EasyEXPERT Application Library Reference, Edition 8
11-67