11 Reliability
[Extended Test Parameters]
IgLimit : Set Current compliance of Gate SMU.
IdLimit: Set Current compliance of Drain SMU.
Note:Is compliance is set by the smaller value from "IdLimt x No_of_Drain"_Ch or "100 mA".
IsubLimit: Set Current compliance of Bulk SMU.
NBTI_PlotTime: Sampling time of the data used for NBTI degradation plot.
RecordSamplingData: On saves the Id sampling data and OFF does not save the data.
YaxStress: Set Y axis maximum of the graph display under the stress condition.
YaxIdMin: Set Y axis maximum under the Id sampling measurements.
YaxStressMin: Set Y axis minimum of the graph display under the stress condition.
No_of_Drain_Ch : 1 or 4ch for drain SMU can be selectable.
[Device_ID_Override]
"DEVICE ID" diaplay in the Results area is made as "New_Device_Id"@"Measured time" if this parameter is set to
"Y".
[Sampling Timing adjustment]
- SamplingDelay: Adjust this parameter so as the start timing of the sampling measurement observed in the
oscilloscope becomes the same as the sampling start display (is "stress_time_at" in the Parameter display).
Note: Recommend to use the default 200 ms.
- Stress_T_adj: Time (negative) for adjusting the stress time accuracy which depends on the measurement setup or a
PC speed used for Desktop EasyEXPERT.
Note: Stress_T_adj parameter is adjustes so as as the "Stree_time_at_" display in the Sampling_Ids graph becomes
closer to the end value of the previos stress time. Default value is tuned for the use on the B1500A EasyEXPERT
and the "RecordSamplingData=ON" condition.
[Test Output: X-Y plot]
X axis: Cumulative stress time or sampling time
Y-axis: Id
Agilent EasyEXPERT Application Library Reference, Edition 8
11-90
To Next Page
Loading...