15 Structure
15.14 Junction BV: Junction device breakdown voltage (A.01.20)
[Supported Analyzer]
B1500A, 4155B, 4155C, 4156B, 4156C
[Description]
Measures the junction device reverse bias characteristics, and extracts the breakdown voltage.
[Device Under Test]
Junction device, diode
[Device Parameters]
L: Junction length
W: Junction width
Temp: Temperature
[Test Parameters]
IntegTime: Integration time
Ianode@BV: Anode current to decide the breakdown
Anode: SMU connected to Anode terminal, primary sweep voltage output
VanodeStart: Sweep start voltage for Anode terminal
VanodeStop: Sweep stop voltage for Anode terminal
VanodeStep: Sweep step voltage for Anode terminal
Cathode: SMU connected to Cathode terminal, constant voltage output
[Extended Test Parameters]
Vcathode: Cathode voltage
HoldTime: Hold time
DelayTime: Delay time
AnodeMinRng: Minimum range for the anode current meausrement
[Measurement Parameters]
Anode current Ianode
Cathode current Icathode
[User Function]
IanodePerArea=Ianode/L/W
IcathodePerArea=Icathode/L/W
[Analysis Function]
BV=@L1X (X intercept of Line1)
[X-Y Plot]
X axis: Anode voltage Vanode (LINEAR)
Y1 axis: Anode current Ianode (LINEAR)
Y2 axis: Anode current Ianode (LOG)
Y3 axis: Cathode current Icathode (LINEAR)
Y4 axis: Cathode current Icathode (LOG)
Agilent EasyEXPERT Application Library Reference, Edition 8
15-26