56
4929B–AUTO–01/07
ATA6264 [Preliminary]
ISO 9141 Mode
16.23 Maximum baud rate K
x
f
Kx
62.5 kBd A
16.24
Propagation delay
TxD
x
= low to K
x
=low
(x = 1, 2),
measured from TxD
x
H to L to K
x
= 0.9 × V
K30
R
Kx
= 510Ω to K30,
C
Kx
= 470 pF to GNDB
K
x
t
PDtL
1µsA
16.25
Propagation delay
TxD
x
=high to Kx=high
(x = 1, 2),
measured from TxD
x
L to H to K
x
= 0.1 × V
K30
R
Kx
= 510Ω to K30,
C
Kx
= 470 pF to GNDB
K
x
t
PDtH
1µsA
16.26 K
x
rise time
(x = 1, 2), measured from
0.1 × V
K30
to 0.9 × V
K30
R
Kx
= 510Ω to K30,
C
Kx
= 470 pF to GNDB
K
x
t
Krise
3µsA
16.27 K
x
fall time
(x = 1, 2), measured from
0.9 × V
K30
to 0.1 × V
K30
R
Kx
=510Ω to K30,
C
Kx
= 470 pF to GNDB
K
x
t
Kfall
3µsA
16.28
Propagation delay K
x
=low
to RxD
x
= low
(x = 1, 2), measured from
K
x
=0.4× V
K30
to
RxD
x
=HtoL
K
x
t
PDkL
4µsA
16.29
Propagation delay K
x
=high
to RxD
x
=high
(x = 1, 2), from
K
x
=0.6× V
K30
to
xD
x
= L to H
K
x
t
PDkH
4µsA
16.30
Symmetry of transmitter
delay
(x = 1, 2),
t
SYM_Tx
=(t
PDtL
+t
Kfall
) –
(t
PDtH
+t
Krise
)
K
x
t
SYM_Tx
–1 1 µs A
16.31
Symmetry of receiver
propagation delay
(x = 1, 2),
t
SYM_Rx
=t
PDkL
–t
PDkH
K
x
t
SYM_Rx
–1 1 µs A
LIN Bus Mode (Necessary for Operation: V
K30
= 8V to 18V)
16.32
Slew rate for rising and
falling edge
Measured between
high level = 0.8 × V
K30
and
low level = 0.2 × V
K30
,
R
K1
=1kΩ to K30,
C
K1
= 3.3 nF to GNDB
K
1
dV
K1
/dt 1 3 V/µs A
16.33 Maximum baud rate K
1
t
Kx
20 kBd A
16.34
Propagation delay TxD
1
low
to K
1
=low
Measured from TxD
1
H-> L to K
1
= 0.9 × V
K30
R
K1
= 1 kΩ to K30,
C
K1
= 3.3 nF to GNDB
K
1
t
PDtL
2.5 µs A
16.35
Propagation delay TxD
1
high
to K
1
= high
Measured from TxD
1
L to H to K
1
= 0.1 × V
K30
R
K1
=1kΩ to K30,
C
K1
= 3.3 nF to GNDB
K
1
t
PDtH
2.5 µs A
16.36
Propagation delay K
1
low to
RxD
1
= low
Measured from
K
1
=0.4× V
K30
to
RxD
1
=HtoL
K
1
t
PDkL
4µsA
Table 17-1. Electrical Characteristics (Continued)– LIN/ISO 9141 Interfaces
No. Parameters Test Conditions Pin Symbol Min Typ. Max. Unit Type*
*) Type means: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter
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