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31
The
voltage
developed
across
C8
causes
IVI4
to
sink
current
through
resistor chain R24,
R25, R29,
R30, R31
until the
voltage developed
across
the chain
balances that across C8,
Thus
the current
required
for
a
particular
range is selected
by
the value of
the resistor
chain switched by Ml, M2
and
Q4,
Simplified
diagram
Fig. 3.30
shows the resistor
chain
and
switching for each
range. On the high resistance
ranges
leakage paths
are provided by
Q3,
M2(B) and M2(C).
To
produce good
common mode
rejection, M4
supplies are
bootstrapped, the
supply span being defined by
a 12
volt zener,
D17.
The
filtered bootstrap supplies
(+^2BS
and OBS)
power the
astable (M6) and
bilateral
switch.
The use
of ohms
guard
permits in-circuit
measurement
of resistors,
provided shunt
paths
are
greater than
25012
and a
suitable
tapping point
is available.
Consider Fig.
3.31
.
Guard
is reference
0,
Lo
is actively
maintained
within
microvolts
of reference
0
(as
previously explained).
Thus
there is no
voltage across
Rz and
consequently no current
in Rz. Voltage
follower
Q10/M3
will simply pass
more
current
into
Ry
from the I-(-
terminal until the
selected
current for the
particular range
flows through
Rx.
3.4.3 Test
During the
self-test routine
(actuated
from the
front
panel or
remotely
programmed),
the
Ohms
Converter is
checked for
correct
operation.
The
circuitry is placed
into
the
10kl2
range as
described
in
Section 3.
2. 1.3.
Filter
is
selected
and
F.E.T. Q5
'closed'
from M9-1
causing R8
(9.76kl2) to be
placed
between
I-t-
and I—.
Thus
with
I-t
and
Hi, I- and Lo
connected
(2-wire if front
panel input
selected),
the
DC
Isolator
(which
is also in the
TEST
mode)
measures the
voltage
developed
across
the resistor
(approx
1
volt). The
resulting voltage
output
from the DC
Isolator
is
applied
to
the A-D
converter,
measured and
compared
to
the
stored
value.
If
the
measured
signal is
within
+
6%
of the
stored value, the test
is complete.
3.5
CURRENT
ASSEMBLY
(Drawing No. 430304)
The Current assembly
contains a set
of
selectable
precision
current
shunts,
the voltage
developed across
the
shunt(s)
being sampled
by
the DC
or AC
voltage
measure-
ment
circuits.