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Hitachi AP1 - Page 23

Hitachi AP1
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Quality Control
Inspection on Material and
Parts for Semiconductor
Devices
Manufacturing Equipment,
Environment,
Sub-material,
Worker Control
Inner Process
Quality Control
100% Inspection
on
Appaarance and Elactrical
Characteristics
Sampling Inspection
on
Appaarance and Electrical
Characteristics
Reliability Test
r-
---------------,
: Quality Information I
I Claim :
:
Field Experience
I General Quality
Information I
~----------------~
QUALITY ASSURANCE
Method
Lot Sampling,
Confirmation
of
Quality Level
Confirmation
of
Quality
Level
Lot Sampling,
Confirmation
of
Quality Level
Telting,
Inspection
Confirmation
of
Quality Level, Lot
Sampling
Feedback
of
Information
Fig~re
2 Flow Chart
of
Quality Control in Manufacturing
Process
21