Hitachi AP1 - Page 29

------------------ RELIABILITY TEST DATA OF MICROCOMPUTER
3.2 Reliability Test Results
Reliability Test Results or 4-bit single-chip microcomputer de-
vices is shown in Table 3 to Table 7.
Table 3 Dynamic Life Test
Device
Package
Sample Size
HMCS47C
DP·64S 90
FP-54 90
HMCS46C
DP-42 90
DP-42S
45
HMCS45C
DP-64S
45
FP-54
120
HMCS44C
DP-42
162
DP-42S 45
LCD-III
FP-80
90
Table
4 High Temperature, High Humidity Test (Moisture Resistance Test)
(1)
85°C 85%RH Bias Test
Package 168 hrs 500 hrs
DIP-type 0/205 0/205
FP-type 0/185 0/185
Condition;C MOS: VCC" 5.5V
(2) High Temperature High Humidity Storage Life Test
a) 65°C/95%RH
Package 168 hrs
500 hrs
DIP-type
0/870 0/870
FP-type
0/545
0/545
1000
hrs
1*/205
1*/185
1000 hrs
1*/870
1*/545
27
Component Hours Failure
90000
0
90000 0
90000 0
45000 0
45000 0
120000
1 *
162000 1
**
45000
0
90000
0
• Surface contamination
•• Aluminum metallization open
• Aluminum corrosion
·Aluminum corrosion
(to be continued)