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complete this card and mail, or FAX to 440/248-6168.
MODEL
SERIAL NO.
DATE
NAME
TITLE
COMPANY
MAIL STOP
ADDRESS
CITY
STATE/PROVINCE
ZIP
COUNTRY
PHONE
FAX
E-MAIL
For FREE additional information, check below:
Application Notes
q
General Purpose Measurements
0 Component Test Applications
Reference Publications
0 Low Level Handbook
0 Switching Handbook
Catalogs
0 Full Line Product Catalog
Facility
(Check One)
Job Function
(Check One)
q
K Aerospace/Defense 0 4 Calibration/Metrology
0 S Automotive/Parts Mfg. 0 6 ComponentTest
0 Q Chemical/Petroleum Processing
0 H Components Mfg. (Non-Semi)
0 C Consulting
0 N Computer/Peripherals 0 G Corp./General Mgmt.
0 T Consumer Electronics 0 7 Education
q
L Digital ICs
0 3 Engineering Design
0 U Discrete Components 0 1 Engineering Management
q
D Displays
0 5 Mfg. Production Test
0 V Distributors/Resellers/Rental 0 0 Purchasing
0 F Education/University 0 8 Quality Assurance/Control
q
B Industrial Controls Mfg.
q
R Medical Equip. and Services
0 2 Research & Development
0 Y Mixed-Signal Components
q
S Safety Manager
0 2 Other Discrete Manufacturing 0 9 Service/Repair
q
0 Optoelectronic Components
0 E System EngineeringRnlegration
0 I Process Control Industries
0 T TestTechnician
0 C Regulatory 0 X Other
q
E Research Laboratories
0 J Semi. Components - Other
0 1 Semiconductor Mfg.
0 2 Semi. Pkg. Part Testing
0 P Telecommunications Equip.
0 G TestiMeawement Equipment Mfg~
0 M Utility
0 4 VAR/System Integrator/Consultant
0 X Other
Product Interest(s)
0 M Acculex Digital Displays
0 G Communications Test
0 7 Current/Voltage Source
0 V C-V Measurements
0 D Data Aquisition Boards
0 R Data Acq. Test &Analysis Software
0 2 Digital Multimeters
0 L Distributed I/O
0 4 Electrometersil’icoammeters
0 A Flat Panel Display Test
0 F Function Generators
0 3 High Resistance Meters
0 E IEEEInterfaces
0 I I-V Characterization
0 N LCZ Meters
0 5 ’ Nanovoltmeters
0 B Network Measurement Modules
0 6 Ohmmeters
0 P PC Instruments
0 K Portable Products
q
8 Precision Power Supplies
0 T Semiconductor Parametric Test
0 H Serial Communication Interfaces
0 J Signal Conditioning Products
0 U Source/Measure Instruments
0 S Switching Systems/Scanners
0 0 Temperature Measurements
0 W Wafer Level Reliability
0 X Other