10
The measured value shows on the display.
Note
• The included point contact temperature probe can only be used
up to 230 °C.
•
The temperature function is type K. For measuring higher tempera-
tures other probes of type K can be used.
Diode test (see fig 3)
Use the diode test to check diodes, transistors, and other semicon-
ductor devices. The diode test sends a current through the semicon-
ductor junction, and then measures the voltage drop across the
junction. A good silicon junction drops between 0.5V and 0.8V.
To test a diode out of a circuit, connect as follows:
1. Insert the red test lead into the HzVΩ terminal and the black test
lead into the COM terminal.
2. Set the rotary switch to diode position.
3. For forward voltage drop readings on any semiconductor compo-
nent, place the red test lead on the component’s anode and
place the black test lead on the component’s cathode.
The measured value shows on the display.
Continuity test (See fig 3)
To test for continuity, connect as follows:
1. Insert the red test lead into the HzVΩ terminal and the black test
lead into the COM terminal.
2. Set the rotary switch to continuity position.
3. Connect the test leads across with the object being measured.
The buzzer sounds if the resistance of a circuit under test is less
than 70 Ω.
Capacitance measurement (See fig 4)
500
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