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optris PI 450i - Characteristic Emissivity

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Emissivity 83-
8.3 Characteristic emissivity
In case none of the methods mentioned above help to determine the emissivity you may use the emissivity
table Appendix A and Appendix B. These are average values, only. The actual emissivity of a material
depends on the following factors:
temperature
measuring angle
geometry of the surface
thickness of the material
constitution of the surface (polished, oxidized, rough, sandblast)
spectral range of the measurement
transmissivity (e.g. with thin films)
Figure 51: Adjustment of the emissivity in the software PIX Connect (menu Tools/ Configuration/ Device)

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