Rlgalla..l
Detector
• Receiving slit # 1
Filter box, receiving slit box, and can be selected. The
K/3
filter can be
installed on the both items.
• Receiving optics
unit#
1
Parallel slit analyzers can be selected.
• Receiving optics unit # 2
Soller slits
can
be selected.
• Receiving slit # 2
A virtual receiving slit which limits the detection area
of
the detector.
• Attenuator
For the adjustment
of
X-ray intensity.
I Detector
In
the detector section, the D/teX Ultra250
10
detector is equipped. Detecting
elements are arranged to effectively detect and integrate X-ray intensities, letting
measurements in broad range be completed
in
a short period time. 0 /teX Ultra
250 and diffracted beam monochromator for D/teX can be used in combination
depending on the measurement purpose. D/teX Ultra 250 can also be changed to
HyPix-400
20
detector.
I Optics switching system
Optics alignment results are retained by SmartLab Studio II. Even when the
optics are changed, the previously stored alignment results are used, eliminating
the need for realignment.
I Optical device detection
SmartLab Studio
II
can check the conditions
of
the following optical devices
used for measurement:
• Selection slit
in
CBO unit
• Type
of
incident Soller slit
or
2-bounce monochromator
• Width
of
incident slit
• Type
of
length-limiting slit
• Presence/absence
of
collimator
• Width
of
receiving slit
• Type
of
analyzer
• Type
of
receiving Soller slit
• Type
of
detector and scan mode
SmartLab SE: Automated Multipurpose X-ray Diffractome
ter
5
To Next Page
Loading...