What to do if the X-ray generator stops during measurement in Rigaku Laboratory Equipment?
If the X-ray generator stops during measurement or other operations, go to the Utility tab in SmartLab Studio II and click on System Status. The part name where the alarm has been generated will be displayed in red. Check the cause to resolve the issue.
What to do if the goniometer stops abruptly during measurement with Rigaku Laboratory Equipment?
If the goniometer stops abruptly during measurement or other operation, it may be due to excessive force applied to the theta_ s or theta_ d arm. Turn the power key on the front panel to OFF to stop SmartLab SE. Check the arms to see if any item obstructs their operation, then restart SmartLab SE.
How to reset alarm status on Rigaku Laboratory Equipment?
To reset the alarm status, click 'Alarm' in the Utility tab, and then click 'Reset'.
What to do if an error occurs during SmartLab SE startup of Rigaku Laboratory Equipment?
If an error occurs during SmartLab SE startup, it could indicate a connection problem between SmartLab SE and the controller. First, check that the Power-On indicator is lit and the Alarm indicator is off. Also, confirm that the connectors are properly connected. After verifying these items, shut down SmartLab Studio II, and then restart it. When restarting SmartLab SE, make sure to restart SmartLab as well.
How to open the door of SmartLab SE Rigaku Laboratory Equipment?
To open the door of SmartLab SE, first confirm that the Door-Lock indicator is lighting up in green. Then, click the door lock button of the Smart Lab Studio II to unlock the door.
General| Brand | Rigaku |
|---|---|
| Model | Smartlab SE |
| Category | Laboratory Equipment |
| Language | English |
Describes the theta-theta goniometer with horizontal sample mount for precise positioning.
Details the three units of the sample section: attachment platform, attachment, and sample holder.
Outlines the specifications of the X-ray generator, including load, voltage, and current ranges.
Explains the CBO system for switching between divergent and parallel beams using selection slits.
Describes the three units of the incident optics section for various beam geometries.
Details the six optical units for reducing background and improving resolution.
Introduces the D/teX Ultra250 1D detector and its capabilities for fast, high-resolution measurements.
Explains how SmartLab Studio II retains optics alignment results when switching optical devices.
Describes how SmartLab Studio II checks and guides optical device configurations.
Integrates alignment, measurement, and analysis in one package for guided procedures.
Identifies key components of the main unit, including PC, power key, and safety features.
Shows and labels the rear panel connectors for power, cooling water, and control cables.
Details the parts of the goniometer: arms, optics sections, detector, and sample section.
Explains the XRD Measurement plugin for controlling the system and performing measurements.
Describes the Data Manager plugin for performing basic data processing tasks.
Procedure for safely powering on and off the SmartLab SE unit using the power key.
Instructions for safely opening and closing the instrument door, considering safety interlocks.
Describes the function and operation of the emergency off switch to cut power in urgent situations.
Guides on how to connect and disconnect optical device cables for system recognition.
Details the optical device for selecting incident beam type, including incident beam path.
Explains various CBO units (Cu, E, α) for switching beam types, listing their applications.
Describes optical devices for conditioning incident X-ray beams, like Soller slits or monochromators.
Slits installed on the theta_s arm to control beam divergence or width.
Base for mounting collimators with parallel beams from multilayer mirrors or CBO-f.
Used for measurements with point beams, added after switching to point focus.
Used to adjust X-ray intensities at the incident side.
Base for mounting BB collimator; Kβ filter can be inserted.
Filter for the incident side to absorb Kβ X-rays, inserted into the BB collimator adapter.
Unit installed on theta_d arm to hold Kβ filter for diffracted beam.
Adapter for installing parallel slit analyzers (PSA) parallel to the 2 theta direction.
Reduces scattered X-ray background, used with receiving slit box.
Adapter for installing receiving Soller slits parallel to the theta_d axis divergence direction.
Functions as a virtual receiving slit, limiting detector area and controlling resolution.
Adjusts diffracted X-ray beam intensity using metal films on a rotating disc.
Semi-conductor 1D detector for efficient, high-speed X-ray intensity detection and integration.
Adapter enabling attachment/detachment of D/teX Ultra250 with optional monochromator.
Removes Kβ X-rays, enhances energy resolution for detecting minor component peaks.
Monochromator for para-focusing optics to monochromatize diffracted beam to Ka X-rays.
Monochromator for Ka X-rays; angle adjustment for bent/flat geometry.
Multi-dimensional semiconductor hybrid pixel array detector for high dynamic range and sensitivity.
Platforms for fixing samples; universal Z allows Z-axis adjustment and various attachments.
Prevents direct X-ray beam from reaching the detector area during measurements.
Effective in reducing backgrounds in 1D measurements with D/teX Ultra250.
Steps for installing attachment bases onto the universal Z attachment platform.
Used with attachment heads on the universal Z platform for powder/bulk samples.
Allows sample rotation (β) on the surface plane for averaging particle size variations.
Enables control of rotational axis (φ) on the sample surface plane in micro angles.
Turret-based attachments for consecutive measurements of multiple samples.
Controls sample rotation (β) and tilt (α) for pole figure and stress measurements.
Controls sample rotation (φ) and tilt (χ) for thin film and pole figure measurements.
Maintains sample at high temperature for observing crystal structure/composition changes.
High-temperature attachment with infrared heater for rapid heating and stable temperature control.
Performs differential scanning calorimetry and XRD simultaneously during heating/cooling.
Various attachments for temperature adjustment (HTK, XRK, TTK, CHC) with specific functions.
Instructions on how to unlock, open clasps, align, and secure an attachment head.
Basic attachment head with no movable axes, used for powder and bulk samples.
Features Rx and Ry axes for tilt adjustments, used for reflectivity and RSM measurements.
Provides +/-10 mm X/Y translation for micro area measurements.
Provides +/-50 mm X/Y translation for 4-inch wafer mapping.
Used to spin capillary-filled samples during measurements.
Used for charging/discharging batteries during X-ray diffraction of electrode materials.
Dome-shaped sample heating unit from Anton Paar for temperature control.
Used with glass/aluminum holders for sample alignment, includes center slit and Si reference.
Used for fibrous/film samples in transmission method, included with SAXS unit.
Used with glass/aluminum holders and β attachment base for sample rotation.
Plates and spacers for wafer-shaped samples, available in 4, 6, and 8-inch sizes.
Used to secure samples up to 3 mm thick on sample plates.
Lists available wafer sample plates (4, 6, 8-inch) and their combinations.
Used for measuring powder samples.
Used for measuring powder or small bulk samples.
Prevents sample holder diffraction X-rays, reducing halos for low angle measurements.
Used for fibrous or film samples in transmission method, included with SAXS unit.
Mounts capillary samples onto the spin attachment head for rotation during measurement.
For reflection and transmission measurements of powder, fibrous, and film samples.
Places samples in a simple airtight condition during measurements.
Lists accessories for the main unit, including Kβ filter, beam stop, and sample holders.
Lists accessories for the fixed sample platform, including center slit and Si reference sample.
Lists accessories for the universal Z attachment platform, like sample plates and heads.
Describes filling powder into holders and inserting into fixed/height reference sample plates.
Mounting bulk samples using aluminum holders or wafer plates based on size.
Mounting fibrous/film samples using transmission SAXS sample holder.
Using wafer plates and spacers for measuring wafer samples, including magnet usage.
Re-adjustment requirements for multilayer mirrors, attenuators, and detectors.
Guidance on checking and maintaining cooling water levels and replacement.
Recommends periodic filter changes to prevent clogging and maintain water pressure.
Precautions for cleaning and maintaining the lead-content glass observation window.
Lists consumables like O-rings, silicone grease, X-ray tubes, and filters.
Addresses issues like door locking, startup errors, goniometer stops, and generator stops.
Explains alarm patterns and sound cues for errors like XG or communication issues.
Explains the generation of continuous and characteristic X-ray spectra.
Illustrates the intensity vs. wavelength spectrum for a copper target.
Lists wavelengths of characteristic X-rays for various target elements.
Discusses the relationship between tube parameters and X-ray intensity, and optimum settings.
Provides formulas and tables to calculate effective sample thickness based on X-ray usage rate.
Detailed explanation of CBO system, its types, and optical paths for beam switching.
Describes Ge/Si crystals for X-ray monochromatization and their applications based on resolution.
Explains the function of Kβ filters and lists elements used as filters for different targets.
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