Rigaku Smartlab SE - αβ Attachment; χφ Attachment

Attachment
I aJ3 attachment
The ap attachment controls the sample surface plane rotational axis (P) and the
sample tilt ax is (a ). Since the sa mple oscillation ax is (r) and the trans mi ssion
geometry is also available, the reflection/trans mi ssion pole figure measurements
can be pe rf ormed. Residual stress measurements are also available.
ap attachment (optional: A00001668)
I X<p attachment
Th e xcp att ac hment controls the sample s urf ace plane rota ti onal axis ( cp ) and the
sample tilt axis ( x) in micro angl es . Thin film measurements are available by
us in g the re fl ectivity rate of thin films. Re fl ectivity pole figu re measurements
and residual measurements are available as well.
Xq> attachment (optional: 24300101)
80 SmartLab SE: A ut omated Multipurpose X-ray Diffractometer
Rigulcu