XY
-20 mm attachment head
I XY-20 mm attachment head
This attachment head has
+/-
l O mm X and Y translation axes which are
perpendicular to each other. It is used to position the sam
pl
e for micro area
measurements. This attachment cannot be used with 8-inch wafer sample plates.
XY-20 mm attachment h
ea
d (optional: 2680A211)
I XY-4 inch
q>
attachment head
This attachment head has
+/-
50 mm provides X and Y translation axes whi
ch
are
perpendicul
ar
to each other.
It
is used for full-map measurement
of
4-inch
wafers. This attachment can be used only with the 4-inch XY mapping
sa
mple
plate.4.
XY-4 inch
q>
attachment head (optional: 2680A212)
SmartLab SE: Automated Multipurpose X-ray Diffractomet
er
87