Rllgaku
Smar/Lab SE, automated multipurpose X-ray diffractometer (hereinafter referred to
as SmartLab SE), is an X-ray diffraction system equipped with a theta-theta
goniometer featuring a horizontal sample mount.
• Out
of
various optics available, the optics suited for the sample or the
measurement purpose can be selected simply by exchanging the unit.
• In addition to the fixed sample platform for powder sample measurements, the
sample section
is
capable
of
combining with a variety
of
attachments such as
for sample surface plane measurements
or
In-situ measurements can be
instaJled.
• The optics and the sample section are controlled via the integrated software
package SmartLab Studio
II
(hereinafter referred to as SmartLab Studio II).
SmartLab Studio
II
gu
id
es the user through the procedures
of
optical device
settings, optical and sample alignment, and measurement condition settings, and
also executes anal
ys
is after the measurement.
• Since the software for measurement and analysis are not separate, the
analysis result can be obtained in a seamless procedure.
• All optical devices are equipped with a sensor. This lets SmartLab Stud
io
II
guide you
to
prepare the optical device configurations that is suitable for the
measurement purpose.
• Measureme
nt
by conventi
ona
l manual operation (Pro Control) is also
ava
il
able.
Taking advantage
of
these features, SmartLab SE allows even inexperienced users
to perform measurements in the same conditions as a specialist would,
just
by
selecting a measurement purpose.
SmartLab
SE
: Automated Multipurpose X-ray Diffractometer 1
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