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Rigaku Smartlab SE - Incident Monochromator Crystal

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Column
Incident
monochromator
crystal
The incident monochromator crystal system uses diffraction by
Ge
or Si crystals for X-ray monochromatization.
Ge(220)x2 crystals and Ge(440)x4 crystals are available as options for SmartLab SE. Select the appropriate crystal
based on the resolution required for measurements and the sample (d value). As an example, the Ge(220)x2 crystal
monochromatizes X-rays by
diffracting them twice by Ge(220) lattice planes. Passing X-rays through this crystal
makes it possible to use
only
Ka.l X-rays. Shown below are the types and resolutions
of
monochromator crystals and
corresponding applications.
Table Types
and
resolutions
of
incident monochromator crystals
Type of
crystals
Ge(220)x2
crystal
Ge(400)x2
crystal
Ge(220)x4
crystals
Ge(440)x4
crystals
Resolution
Applications
(FWHM)
For
applications requiring monochromatized
0.008°<
Kat
X-rays
or
for measurements
of
materials
with diffraction planes with d spacings
of
ca. 2
A.
0.0022°<
For
measurements
of
materials with diffraction
planes with d spacings
of
ca. 1.4
A.
0.0033°<
For
applications requiring high resolution over a
broad 2-theta range.
0.0015°<
For
applications requiring very high resolution
over a broad 2-theta range.
Slit collimation
- - - · Ge(220)x2 crystal
- - Ge(220)x4 crystals
..........
l--
-f-
1-,....
_
......
11
1)
1\
69.00 69. 10
',
.1--
J
..
_
......
69.20
l
J \
6
1.00
63.00
65.00 67.00 69.00
20/co
(deg]
2-theta/omega scan profile of
Si(OOl)
single crystal wafer measured with
different incident optics systems

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