Rigaku Smartlab SE - Sample Holding Magnets

Rlgalcu
Wafer smnple plate and samp le spacer
Magnets are generally used to secure the sample in place. For details on how to
mount
samp les, see Wafer-shaped samples.
0
0
0
Sample holding magnets
lf'll[p) The sample holding magnets can be used for sampl es measuring up to approximately 3 mm
in thickness.
The Z axis is used to align the sample surface with the center of the X-ray beam.
Since the thickness range for which the
Z ax is can be adjusted is 9 mm, you
must select the appropriate sample spacer based on the thickness
of the samp le
to be measured.
Measurable sample
thickness
Oto 3 mm
(optional: 2680A406)
3 to 12 mm
(optional:
AOOOOJ 187)
1
2to21 mm
( optional:
AOOOO 1188)
Oto 9 mm(* I)
Table Sample spacers
Abbreviation
0-3 mm
3-12
mm
12-21 mm
0-9mm
(blue stamped mark)
Illustration
* I When the XY-4 inch ¢ attachment head is used, th e thickness ind.icated by tl1e blue starnped mark
on the sample spacer is available.
SmartLab
SE: Automated Multipurpo se X-ray Diffractom ete r 93