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Samsung LE26A41B - Test Pattern; Check Sum

Samsung LE26A41B
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4 Alignments and Adjustments
LE26A41B/LE32A41B 4-15
4-3-8 MDIN-150
* Control the specify item that a output signals (RF, CVBS, S-VHS Modes) of MDIN-150 (IC405).
* This data can be changed without notice.
4-3-9 Test Pattern
* Use below test patters to demonstrate the image display of PW565 (IC602).
1) Luma Ramp (16 step)
2) Luma Ramp (128 Step)
3) White 16
4) White 240
5) Color Bar
6) RGB Ramp (32 Step)
4-3-10 Check sum
* XXXX : Displays the current check sum size of the MICOM.
(Varies depending on program update)
4-3-11 Reset
* Initializes the data in the MICOM. (Set to default value)
Use ‘Reset’ to restore adjustmints made in Factory Mode to the original settings.
4-3-12 T_NPL26PEU_0130 03/08/2004 18:34:23
* Displays the MICOM program version
4-3-7 DNIe
* Control the specify item that a output signals of scalar (PW565).
* This data can be changed without notice.

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