Samsung UN75JU7100F - Test Pattern

Factory Menu Name Data Range
IR Blaster Upgrade Failure
IR Blaster delay time 50
NTV Cu Update Failure
UD LDC PROFILE UPGRADE Failure
Pic Data USB Update VER:0x000
Audio Data USB Update
Eco Data USB Update VER:0x0035
CI CPLD Upgrade Failure
SC ADK Upgrade Failure
SC MBR Upgrade Failure
SC MCU Upgrade Failure
TCON DEMURA FW UPGRADE NG
Reset
OPTION_HDMI
DVB CI
European specications
Test Pattern
* the Output of test pattern from each IC
Other setting
SVC Panel
ORIGINAL
Tizen
S/N
ADC/WB 
Factory Menu Name Data Range
ADC
AV Calibaration NA
Comp Calibration NA
PC Calibration NA
HDMI Calibration NA
ADC Result
1st_Y_GH 255
1st_Y_GL 246
1st_Cb_BH …
1st_Cb_BL …
1st_Cr_RH …
1st_Cr_RL ..
2nd_R_L 129
2nd_G_L 129
4-19
4. Troubleshooting