Technical data of CPU 31xC
6.6 Technical data of the integrated I/O
CPU 31xC and CPU 31x, Technical Data
6-52 Manual, 01/2006 Edition, A5E00105475-06
Technical data
Permitted potential difference
• between M
ANA
and M
internal
(U
ISO
)
75 VDC / 60 VAC
Insulation test voltage 600 VDC
Analog value generation
Resolution (including overdrive) 11 bits + signed bit
Conversion time (per channel) 1 ms
Settling time
• with resistive load
0,6 ms
• With capacitive load
1,0 ms
• With inductive load
0.5 ms
Interference suppression, error limits
Crosstalk between the outputs > 60 dB
Operational error limits (across the temperature range, in relation to output
range)
• Voltage/current
± 1 %
Basic error limit (operational limit at 25 °C, in relation to output range)
• Voltage/current
± 0,7 %
Temperature error (in relation to output range) ± 0.01 %/K
Linearity error (in relation to output range) ± 0,15 %
Repeat accuracy (in transient state at 25 °C, in relation to output range) ± 0,06 %
Output ripple; bandwidth 0 to 50 kHz (in relation to output range) ± 0,1 %
Status, interrupts, diagnostics
Interrupts
• no interrupts when operated as standard
I/O
• For using technological functions, please
refer to the
Technological Functions
Manual.
Diagnostics functions
• no diagnostics when operated as
standard I/O
• For using technological functions, please
refer to the
Technological Functions
Manual.
Actuator selection data
Output range (rated values)
• Voltage
± 10 V
0 V to 10 V
• Current
± 20 mA
0 mA to 20 mA
4 mA to 20 mA
Load resistance (within output rating)
• For voltage outputs
– Capacitive load
Min. 1 kΩ
Max. 0.1 μF
• For current outputs
– Inductive load
Max. 300 Ω
0.1 mH
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