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Tektronix TDS 520B Technical Reference

Tektronix TDS 520B
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Performance Tests
TDS Family Performance Verification and Specifications
1–25
TDS 500B/700A Test Record (Cont.)
Instrument Serial Number: Certificate Number:
Temperature: RH %:
Date of Calibration: Technician:
TDS 500B/700A Performance Test MaximumOutgoingIncomingMinimum
Delay Between Channels
Delay Between Channels N/A __________ __________ 50 ps
Time Base System
Long Term Sample Rate/
Delay Time @ 100 ns/10.0 ms
–2.5 Div __________ __________ +2.5 Div
Trigger System Accuracy
Pulse-Glitch or Pulse-Width,
Hor. scale 1 ms
Lower Limit
Upper Limit
3.5 ns
3.5 ns
__________
__________
__________
__________
6.5 ns
6.5 ns
Pulse-Glitch or Pulse-Width,
Hor. scale > 1 ms
Lower Limit
Upper Limit
1.9 ms
1.9 ms
__________
__________
__________
__________
2.1 ms
2.1 ms
Main Trigger, DC Coupled, Positive Slope 9.9393 V __________ __________ 10.1147 V
Main Trigger, DC Coupled, Negative Slope 9.9393 V __________ __________ 10.1147 V
Delayed Trigger, DC Coupled, Positive Slope 9.9393 V __________ __________ 10.1147 V
Delayed Trigger, DC Coupled, Negative Slope 9.9393 V __________ __________ 10.1147 V
CH1 Sensitivity, 50 MHz, Main Pass/Fail __________ __________ Pass/Fail
CH1 Sensitivity, 50 MHz, Delayed Pass/Fail __________ __________ Pass/Fail
CH1 AUX Trigger Input Pass/Fail __________ __________ Pass/Fail
CH1 Sensitivity, full bandwidth, Main Pass/Fail __________ __________ Pass/Fail
CH1 Sensitivity, full bandwidth, Delayed Pass/Fail __________ __________ Pass/Fail
Output Signal Checks
MAIN TRIGGER OUTPUT, 1 MW
High
Low
High 2.5 V __________
__________
__________
__________
Low 0.7 V
MAIN TRIGGER OUTPUT, 50 W
High
Low
High 1.0 V __________
__________
__________
__________
Low 0.25 V
DELAYED TRIGGER OUTPUT, 50 W
High
Low
High 1.0 V __________
__________
__________
__________
Low 0.25 V
DELAYED TRIGGER OUTPUT, 1 MW
High
Low
High 2.5 V __________
__________
__________
__________
Low 0.7 V

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Tektronix TDS 520B Specifications

General IconGeneral
BrandTektronix
ModelTDS 520B
CategoryTest Equipment
LanguageEnglish

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