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Tektronix TDS 784D User Manual

Tektronix TDS 784D
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Measuring Waveforms
TDS 500D, TDS 600B, & TDS 700D User Manual
3–137
Consider the following rules when taking a snapshot:
Be sure to display the waveform properly before taking a snapshot. Snapshot
does not warn you if a waveform is improperly scaled (clipped, low signal
amplitude, low resolution, etc.).
To vary the source for taking a snapshot, simply select another channel,
math, or ref memory waveform and then execute snapshot again.
Note that a snapshot is taken on a single waveform acquisition (or acquisi-
tion sequence). The measurements in the snapshot display are not continu-
ously updated.
Be careful when taking automatic measurements on noisy signals. You might
measure the frequency of the noise and not the desired waveform.
Note that pushing any button in the main menu (except for Snapshot) or any
front panel button that displays a new menu removes the snapshot from
display.
Use High-Low Setup (page 3–132), Reference Levels (page 3–132), and
Gated Measurements (page 3–130) with Snapshot exactly as you would
when you display individual measurements from the Select Measrmnt
menu.
Measurement statistics display information about each measurement (see
Figure 3–59 on page 3–129). As measurements are updated, the displayed
measurement value can change. Measurement statistics display either the mean
and standard deviation or the minimum and maximum values of measurements.
NOTE. Statistics are not displayed for Phase, Delay, and histogram measure-
ments.
Display Measurement
Statistics (TDS 500D and
TDS 700D Only)

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Tektronix TDS 784D Specifications

General IconGeneral
BrandTektronix
ModelTDS 784D
CategoryTest Equipment
LanguageEnglish

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