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General| Manufacturer | Veeco |
|---|---|
| Model | 004-210-000 |
| Category | Microscope |
| Power Requirements | 100-240 VAC, 50/60 Hz |
| Type | Atomic Force Microscope (AFM) |
| Scan Range | 90 µm x 90 µm |
| Operating Modes | Contact, Tapping |
| Sample Size | Up to 200 mm |
Provides an overview of the MultiMode scanning probe microscope (MM-SPM) and its capabilities.
Details general safety precautions, rules, and requirements for operating the MM-SPM.
Outlines the technical specifications of the MultiMode SPM, including scanners, image size, and resolution.
Provides an overview of the MultiMode SPM system's major hardware components.
Explains the electronic feedback loop and control mechanisms for precise tip-sample interaction.
Discusses various gains (proportional, integral, LookAhead) used to optimize SPM feedback circuits.
Details commonly used control parameters and how they affect image quality and feedback.
Provides instructions for setting up the computer, controller, and monitors for the MultiMode SPM.
Lists all necessary components included with the MultiMode SPM system.
Details the procedure for unpacking the NanoScope system's components.
Explains the importance of isolating the microscope from vibration sources for optimal imaging.
Provides instructions for preparing and powering up the MultiMode SPM system.
Describes the procedure for removing silicon cantilever substrates from the wafer.
Explains the subtleties of etched silicon probe tip shapes for optimal imaging.
Details the procedure for removing silicon nitride cantilever substrates from the wafer.
Discusses the general shape and considerations for silicon nitride probe tips.
Covers initial steps for preparing the sample before contact AFM imaging.
Describes methods for aligning the laser for all modes except STM.
Guides the user through starting the NanoScope software and selecting the microscope.
Explains the SPM's voltage meters and their interpretation for various signals.
Details steps for preparing the system before contact AFM imaging.
Provides recommended initial settings for control panels for contact AFM.
Guides the user through the process of engaging the tip with the sample surface.
Discusses optimization of scan parameters for successful contact AFM imaging.
Explains the fundamental principles of TappingMode AFM operation.
Details the preparation steps required before TappingMode imaging.
Guides the user through the process of engaging the tip for TappingMode imaging.
Discusses subtle aspects of TappingMode operation and cantilever resonating techniques.
Introduces AFM imaging of samples in fluid and its applications.
Details the general procedures for operating the SPM with a fluid cell.
Provides instructions for TappingMode imaging specifically in fluid environments.
Offers solutions for common problems encountered during fluid imaging.
Provides an overview of Scanning Tunneling Microscopy (STM) principles and operation.
Details the system setup and procedures for imaging conductive samples using STM.
Explains spectroscopic operations and STS plot modes available with the NanoScope STM.
Provides detailed instructions for performing low-current (sub-picoamp) STM measurements.
Details the fundamental setup and operation for Lateral Force Microscopy (LFM).
Explains advanced techniques for LFM, including scan direction and tip selection.
Uses an analogy to explain the concept of force plots for tip-sample interactions.
Describes the Force Calibration mode for checking tip-sample interactions.
Details the various control panels and menus used in Force Calibration mode.
Provides instructions for obtaining and interpreting force curves in contact AFM.
Explains force calibration procedures specifically for TappingMode.
Describes the operation of force modulation mode for imaging sample stiffness or elasticity.
Introduces interleave scanning and LiftMode for simultaneous data acquisition.
Explains how enabling Interleave mode changes the tip's scan pattern relative to the imaged area.
Describes the motion of the tip during the Interleave trace and retrace in Lift Mode.
Provides instructions for operating interleave scanning and Lift Mode across different AFM modes.
Details additional considerations for using LiftMode in conjunction with TappingMode.
Explains the principles of Magnetic Force Microscopy (MFM) using interleave and LiftMode.
Provides instructions for obtaining MFM images using LiftMode of Interleave scanning.
Details the installation of Basic Extender, Quadrex Extender, and NanoScope IV for MFM imaging.
Guides users through software setup for MFM imaging with extender modules.
Offers solutions for common issues encountered during MFM imaging.
Provides an overview of Electric Force Microscopy (EFM) and its applications.
Explains the theoretical principles behind electric field gradient detection.
Details preparation steps, including jumper configurations, for EFM imaging.
Outlines procedures for electric field gradient detection, including phase and amplitude detection.
Explains the theoretical principles of surface potential detection using EFM.
Details preparation steps for surface potential detection, including voltage application.
Provides the procedure for surface potential imaging and troubleshooting the feedback loop.
Provides an overview of the software-guided calibration procedure for Veeco MultiMode SPMs.
Details the steps for setting up the microscope for calibration.
Explains how to check and adjust sample scan orthogonality along the X- and Y-axes.
Describes optimizing linearity correction parameters for individual scanners.
Provides fine-tuning steps for maximum X-Y measuring accuracy at different scan sizes.
Details the procedure for obtaining accurate Z-axis measurements and calibration.
Addresses common problems and cures associated with contact AFM operation.
Provides solutions for common issues encountered during TappingMode AFM operation.
Offers solutions for common problems encountered during fluid imaging.
Covers maintenance procedures for adjustment screws to ensure smooth operation.
Details the procedure for replacing fuses in the NanoScope controller.
Covers installation, use, and maintenance of vertical engagement scanners.
Addresses common issues and troubleshooting steps for vertical engagement scanners.
Outlines Veeco's warranty policy for standard equipment.
