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General| Type | Atomic Force Microscope (AFM) |
|---|---|
| Z Range | 6.5 μm |
| Software | Nanoscope |
| XY Resolution | 1 nm |
| Z Resolution | 0.1 nm |
| Sample Size | Up to 200 mm diameter |
| Image Resolution | 512 x 512 pixels |
| Resolution | 1 nm |
| Tip Type | Silicon |
| Operating Mode | Contact, Tapping |
| Modes | Contact, Tapping |
Provides a general overview of the Dimension 3100 Scanning Probe Microscope and its configurations.
Details the components of the Dimension 3100 SPM control station including input/display devices and controllers.
Describes the main components of the Dimension 3100 SPM system, including electronics, optics, and head.
Specifies the maximum sample size and thickness, and handling recommendations for the Dimension 3100.
Directs users to Chapter 18 for detailed information on maintaining and troubleshooting the Dimension 3100 SPM.
Details safety symbols and their meanings, covering hazards like electrical, laser, and mechanical risks.
Outlines essential precautions for operators to avoid injury and equipment damage, including general safety.
Provides critical safety guidelines for operators, emphasizing qualified personnel and adherence to safety regulations.
Details the procedures for powering up the system during installation or servicing, including pre-checks.
Guides users through the software startup process, including logging into Windows NT and starting NanoScope.
Describes typical system configurations like VT-103-3K with ELCON, VT-102, and IS3K-2.
Outlines the general facility requirements for installing and operating the Dimension 3100 SPM.
Details requirements for acoustic and vibration isolation systems like IS3K-2 and VT-103-3K.
Provides recommendations for environmental conditions, power, air, and vacuum for the Dimension 3100 system.
Details the necessary equipment and procedures for receiving and inspecting the Dimension 3100 system.
Provides step-by-step instructions for installing the Dimension 3100 SPM unit and control station.
Guides users through connecting the control station and microscope external components to the system.
Details the procedures for powering up the system after installation, including hardware and software steps.
Explains methods for mounting samples using vacuum chucks and magnetic pucks on the stage.
Details essential stage control commands like Load New Sample, Locate Tip, and Initialize.
Describes the procedure for loading or unloading a sample from the stage using the software.
Explains how to initialize the stage to locate limit switches and reset coordinates for proper operation.
Provides instructions for preparing silicon cantilever substrates, including using the wafer tool kit.
Details the steps for preparing cantilevers for imaging, including substrate removal and inspection.
Discusses the theoretical tip shapes of etched silicon probes and their effects on imaging.
Explains the procedure for removing silicon nitride cantilever substrates from the wafer.
Covers essential system information including mouse vs trackball usage and motor interlocks.
Provides fundamental steps for AFM operation, including selecting microscope, mode, and preparing components.
Details the procedure for aligning the laser beam onto the cantilever for optimal imaging.
Explains how to use the locate tip function to position the tip using optical focal distance measurements.
Describes the process of engaging the tip with the sample surface for AFM operation.
Covers fundamental operational procedures for Contact Mode AFM, including setup and alignment.
Guides users on adjusting the photodetector to center the laser spot for optimal signal detection.
Details how to set initial scan parameters in the Scan Controls and Feedback Controls panels.
Discusses optimizing scan parameters like Data Type, Gain Settings, and Setpoint for Contact Mode AFM.
Explains how to use Force Calibration mode to check tip-sample interactions and determine optimal setpoints.
Explains the fundamental principles of TappingMode AFM, including cantilever oscillation and signal generation.
Provides fundamental steps for TappingMode AFM operation, including setup and parameter adjustment.
Details steps to find the cantilever's resonance peak and adjust oscillation amplitude for optimal imaging.
Discusses advanced TappingMode techniques like optimizing scan parameters and gain settings.
Explains how to check and adjust cantilever tune after engaging for optimal image quality.
Covers basic principles of fluid imaging, including advantages and similarities to air operation.
Details the specialized hardware for fluid imaging, including the fluid tip holder and protective skirt.
Provides notes on sample binding for AFM imaging, covering both large and small samples in fluid.
Highlights crucial precautions for fluid imaging, especially spillage and handling of the scanner.
Details operating principles for fluid imaging, including cleaning, mode selection, and probe loading.
Introduces STM, its reliance on tunneling current, and basic principles of operation.
Explains how to perform STM imaging, including sample loading and setting scan parameters.
Covers STM-specific details like operating modes, menu parameters, and optimization strategies.
Addresses common problems encountered during STM operation, including image issues and tip crashes.
Introduces Lateral Force Microscopy (LFM) for measuring frictional forces on sample surfaces.
Details the setup and basic operation of LFM, including scan parameters and line direction.
Covers advanced LFM techniques like scan direction, tip selection, and understanding LFM signals.
Explains the convention for LFM data visualization, where lighter colors mean higher friction.
Describes how to enhance LFM data by subtracting trace from retrace images for improved clarity.
Explains force plots using an analogy to measure magnet strength and understand tip-sample interactions.
Details Force Calibration mode for checking cantilever-sample interactions and setting optimal setpoints.
Provides an example of a Contact Mode AFM force plot and its interpretation.
Describes the parameters and menus used for controlling force calibration, including ramp and feedback controls.
Provides detailed instructions for obtaining and adjusting force curves in Contact Mode AFM.
Introduces Interleave scanning and LiftMode, explaining their use for simultaneous data acquisition.
Describes how enabling Interleave alters the scan pattern for acquiring multiple data types concurrently.
Explains LiftMode, where the tip is lifted to measure far-field forces while minimizing topography influence.
Provides instructions for operating Interleave scanning and LiftMode across various AFM modes.
Discusses additional considerations for using LiftMode with TappingMode, including parameter selection.
Introduces Magnetic Force Microscopy (MFM) and its principles, including force gradient detection.
Explains how force gradients are detected via cantilever resonant frequency shifts in MFM.
Provides basic steps for MFM operation using Interleave and LiftMode, focusing on phase and amplitude.
Details how to use LiftMode for MFM imaging, minimizing topography influence for better magnetic data.
Covers advanced MFM techniques like fine-tuning interleave controls and adjusting drive amplitude.
Introduces Electric Force Microscopy (EFM) and Surface Potential Detection, similar to MFM procedures.
Details the theory, preparation, and procedures for Electric Force Microscopy (EFM).
Explains how to apply voltage to the tip or sample for generating electric fields using jumper configurations.
Describes phase detection technique for EFM, available with Extender Electronics Module.
Explains frequency modulation (FM) technique for quantitative measurement of resonant frequency shifts.
Provides an overview of the software-guided calibration procedure for Dimension SPMs.
Explains the theory of scanner calibration, including piezoelectric material behavior and sensitivity.
Details the steps for setting up calibration, including checking scanner parameters and aligning references.
Guides users on checking and adjusting the sample scan for X- and Y-axis orthogonality.
Provides procedures for optimizing linearity correction parameters for scanners, especially long-range ones.
Covers general maintenance for the Dimension 3100 system, including cleaning and calibration checks.
Details cleaning procedures for major components, SPM stage, optics, and scanner parts.
Provides instructions on how to change the illuminator light bulb, the only user-serviceable part.
Lists fuse characteristics for NanoScope Controller, Illuminator, and Vacuum Pump boards.
Addresses common problems, alarms, and error messages encountered with the Dimension 3100 system.
