To Next PageTo Next Page
Need help?Do you have a question about the Veeco Digital Instruments Dimension 3100 and is the answer not in the manual?
General| Brand | Veeco |
|---|---|
| Model | Digital Instruments Dimension 3100 |
| Category | Industrial Equipment |
| Language | English |
General introduction to the Dimension 3100 SPM and its capabilities.
Contact information and support details for Digital Instruments Veeco.
Details on the typical configurations and features of the Dimension 3100 SPM.
Lists and describes key features of the Dimension 3100 SPM, including stage and controller.
Describes the components of the Dimension 3100 SPM control station.
Details the keyboard, monitors, and trackball used for system operation.
Explains the role of the computer as the main control unit for the SPM system.
Describes the NanoScope IIIa controller's function in managing microscope head and scanning.
Explains the Dimension 3100 controller's role in vacuum, air supply, and optics illumination.
Provides an overview of the Dimension 3100 SPM system's main components.
Details the function and components of the Microscope Electronics Box.
Explains the optic system's role in locating the cantilever and tip relative to the sample.
Describes the Dimension 3100 X-Y and Z stage systems and their capabilities.
Explains the function of the Dimension SPM Head in imaging stationary samples.
Describes the cantilever holder and its role in different operating modes.
Details the sample size limitations and handling recommendations.
Refers to Chapter 3 for facility site, safety, and configuration requirements.
Lists common applications of the Dimension 3100 SPM.
Refers to Chapter 18 for maintenance and troubleshooting information.
Introduces safety requirements for installation and operation of the Dimension 3100 SPM.
Details safety symbols and their meanings.
Provides crucial precautions for operators to avoid injury and damage.
Lists general safety guidelines for operators working with the system.
Covers safety applications related to equipment.
Shows the physical footprint and space requirements for the Dimension 3100 SPM.
Details the power-up procedure for installation and service personnel, not untrained users.
Lists essential checks before connecting facilities and powering up the system.
Describes the standard procedure for powering up the system for normal operation.
Outlines steps to prepare the system before normal power-up.
Provides a checklist for normal system power-up.
Details the steps for powering up the system software.
Identifies hazard labels found on the Dimension 3100 SPM.
Describes laser warning labels and their placement.
Details facility site, safety, and configuration requirements for the Dimension 3100 SPM.
Describes typical configurations for the Dimension 3100 SPM, including vibration isolation.
Details the VT-103-3K and ELCON console configuration.
Describes the VT-102 configuration with an air table and typical "table top" control station.
Details the compact IS3K-2 configuration with integrated vibration isolation and acoustic enclosure.
Provides facility requirements, including weight and general notes.
Discusses systems for acoustic and vibration isolation.
Provides dimensions, utilities, and clearance information for the Axiom IS3K-2.
Provides dimensions, utilities, and clearance information for the Axiom VT-103-3K.
Provides dimensions and utilities for the Axiom VT-102 vibration isolation table.
Details facility requirements for the computer and controller setup.
Describes the ELCON console as an optional enclosure for computer/controller.
Summarizes facilities requirements for different configurations.
Specifies environmental conditions for acoustic and vibration levels.
Provides general recommendations for facility setup.
Details the installation procedure from receiving to full setup of the Dimension 3100 SPM.
Covers the necessary steps and equipment for shipping and receiving the system.
Lists the essential equipment received for successful installation.
Provides instructions for safely uncrating the Dimension 3100 SPM system components.
Step-by-step guide to uncrating the SPM system.
Details the process of installing the Dimension 3100 SPM unit and its components.
Instructions for placing and securing the main SPM unit.
Steps for setting up and placing the control station equipment.
Instructions for connecting the various system components and cables.
Details connecting the display and input devices to the computer.
Instructions for connecting the microscope electronics box and controller.
Describes the procedure for powering up the entire system after installation.
Introduces the sample stage capabilities and menu commands.
Details methods for mounting samples using vacuum chucks and magnetic pucks.
Explains the use of vacuum chucks for securing samples.
Describes using magnetic pucks for sample mounting.
Defines the X and Y axis orientation for stage movements.
Discusses important stage menu commands for sample manipulation.
Provides instructions for loading or unloading a sample using the software.
Details the procedure to find and center the probe tip using the optical system.
Offers a menu-driven method for aligning lasers onto cantilevers.
Explains how to focus on the sample surface manually or automatically.
Enables quick stage indexing to a defined X-Y coordinate.
Used to set the origin point on the sample surface for subsequent moves.
Allows automatic stage positioning using a series of memorized positions.
Allows system software to locate top limit switches on SPM axis and optics axis stages.
Lists important Z-axis parameter values for loading/unloading and engaging samples.
Introduces cantilever preparation for TappingMode and Contact Mode AFM.
Details the preparation of silicon cantilever substrates used in TappingMode.
Lists the contents of the wafer tool kit for silicon cantilever substrates.
Provides the procedure for removing silicon cantilever substrates from the wafer.
Discusses the theoretical tip shape of etched silicon probes and their effects.
Details the preparation of silicon nitride cantilevers for Contact AFM.
Describes the shape, dimensions, and spring constants of silicon nitride probes.
Covers SPM setup and operation for Contact and Tapping modes.
Provides information on mouse vs. trackball, motor interlock, and laser requirements.
Explains the exclusive operation of certain functions by the mouse and trackball.
Describes the software interlock against motion if a valid sum (laser signal) is not present.
Details precautions and requirements related to the laser system.
Outlines basic operational procedures for Contact Mode and Tapping Mode AFM.
Steps to set the microscope head configuration.
Instructions for selecting the desired AFM mode (Contact or Tapping).
Describes preparing the cantilever holder for substrate loading.
Details the procedure for installing a silicon nitride substrate onto the AFM cantilever holder.
Instructions for removing the Dimension SPM head.
Steps to mate the cantilever holder sockets to the Dimension SPM head pins.
Instructions for sliding the Dimension SPM head back into the dovetail groove.
Details connecting the SPM head's 21-pin connector.
Provides procedures for aligning the laser beam relative to the cantilever.
Explains how to adjust the photodetector to center the red dot.
Steps to locate and center the tip end of the cantilever.
Recommends imaging the calibration sample and provides small sample preparation steps.
Instructions for focusing on the sample surface.
Details the process for tuning the cantilever in Tapping Mode.
Sets initial scan parameters for parameters like scan size and scan rate.
Describes the process to engage the tip with the sample surface.
Raises the Z stage to ensure tip clearance when the microscope head is installed.
Discusses more subtle aspects of AFM operation.
Details default and adjustable stage parameters for speeding up the engage sequence.
Covers operating procedures for Dimension 3100 SPM in Contact Mode AFM.
Provides a general outline of basic operational procedures for Contact Mode AFM.
Steps to set the microscope head configuration.
Instructions for selecting Contact Mode as the operation mode.
Instructions for installing the tip and loading the cantilever holder.
Details how to align the laser using the laser control knobs.
Explains how to adjust the photodetector to center the red dot.
Steps to center the tip end of the cantilever under crosshairs.
Instructions for focusing on the sample surface using the trackball.
Sets initial scan parameters like scan rate and scan angle.
Describes the process of engaging the tip with the sample surface.
Provides more detailed information on AFM operation in Contact Mode.
Discusses selecting appropriate cantilevers for Contact Mode AFM.
Explains how to optimize scan parameters for successful Contact Mode AFM application.
Details how the Data type parameter affects collected data like Height and Deflection.
Explains how Integral, Proportional, and LookAhead gains control feedback on piezo height.
Discusses how scan size and scan rate affect data output.
Defines the desired voltage for the feedback loop, affecting cantilever deflection.
Describes the lowpass filter for removing high-frequency noise from data.
Explains the highpass filter for removing low-frequency effects.
Allows checking the interaction between cantilever and sample surface.
Details procedures for Dimension 3100 SPM operation in fluid.
Discusses attractive forces due to surface tension and refractive effects.
Describes the optional fluid tip holder and protective skirt.
Details the fluid tip holder and its components.
Provides suggestions for soft cantilevers and oxide sharpened tips for biological applications.
Describes the rubber protective skirt used to protect the scanner tube from liquids.
Provides general notes on sample binding and preparation for fluid operation.
Discusses immobilizing samples on a rigid support and binding methods.
Describes imaging a small region under a drop of fluid for larger samples.
Discusses imaging smaller samples fully immersed in a liquid bath.
Details the steps for operating the SPM in fluid.
Instructions for mounting a cantilever substrate into the holder.
Steps for installing the fluid cantilever holder onto the SPM head.
Instructions for installing the protective skirt.
Refers to Chapter 7 for laser alignment procedures.
Explains false reflections from the glass surface and how to ignore them.
Describes lowering the tip holder into the liquid to form a meniscus.
Details how to readjust laser alignment after lowering the tip into fluid.
Steps to center the laser spot and set initial deflection and setpoint values.
Instructions for locating the tip using the optical microscope objective.
Procedures for focusing on the sample surface, considering fluid effects.
Verifies scan parameters like scan rate and integral gain are reasonable.
Describes the engage command for fluid operation.
Details adjusting scan parameters to obtain the best image, considering softer samples in fluids.
Provides steps to clean the fluid cell and protective skirt to reduce contamination.
Details procedures for operating Dimension 3100 SPM in Tapping Mode in air.
Explains the principles of cantilever oscillation and signal generation in Tapping Mode.
Outlines basic operational procedures for Tapping Mode AFM.
Steps to set the microscope head configuration.
Instructions for selecting Tapping Mode.
Instructions for installing the tip and loading the cantilever holder.
Details how to align the laser using control knobs.
Explains how to adjust the photodetector.
Steps to locate and center the tip end of the cantilever.
Instructions for focusing on the sample surface.
Describes finding the resonance peak and adjusting oscillation voltage.
Sets initial scan parameters for Tapping Mode.
Describes the engage command for bringing the tip into tapping range.
Steps for withdrawing the tip and ascending to sample clearance height.
Discusses subtle aspects of operating the Dimension 3100 in Tapping Mode.
Highlights the importance of understanding cantilever resonating techniques.
Explains the role of cantilever oscillation response in Tapping Mode.
Discusses tuning drive frequency to improve scanning performance.
Encourages review of Section 8.4 for parameter optimization.
Explains how Data type parameter affects collected data in Tapping Mode.
Details setting Integral and Proportional gains for Tapping Mode.
Discusses how scan size and scan rate affect data output.
Provides guidance for common troubleshooting issues in Tapping Mode.
Troubleshooting steps if a peak in the frequency response plot does not appear.
Troubleshooting steps if the engage process aborts.
Details Tapping Mode operation in fluids and related procedures.
Discusses advantages of Tapping Mode in fluid for imaging under native liquid conditions.
Provides crucial precautions, especially regarding fluid spillage.
Outlines precautions to prevent fluid spillage around the SPM.
Provides basic operational procedures for Tapping Mode AFM in fluids.
Steps to set the microscope head configuration.
Instructions for selecting Tapping Mode.
Instructions for head, cantilever, and sample preparation for fluid operation.
Refers to Chapter 7 for laser alignment procedures.
Explains how to adjust the photodetector for fluid imaging.
Steps to locate and center the tip end of the cantilever.
Instructions for focusing on the sample surface, considering fluid effects.
Details finding the cantilever resonance in fluid.
Sets initial scan parameters for fluid imaging.
Describes the engage command for fluid operation.
Provides steps for cleaning the fluid cantilever holder.
Guides selection and mounting of tips for fluid operation.
Instructions for attaching the protective skirt to the fluid cell.
Steps for plugging the fluid cell into the Dimension head.
Procedures for locating the tip with the optical microscope objective.
Steps for preparing the sample for imaging in fluid.
Instructions for slowly remounting the Dimension head.
Ensures all Dimension 3100 surfaces are free of spilled fluid.
Steps to set the AFM mode parameter to Tapping.
Provides initial scan parameter settings for fluid imaging.
Details finding the cantilever resonance in fluid.
Adjusts drive amplitude for protein samples and taller samples.
Readjusts the photodiode until cantilever deflection is zero.
Describes the engage command for fluid operation.
Optimizes setpoint for best images, often 5-10% below RMS amplitude.
Provides guidance for common troubleshooting issues in Tapping Mode AFM in Fluids.
Troubleshooting steps for poor cantilever tune plots.
Troubleshooting steps for absent or weak laser sum signal.
Addresses issues related to poor image quality, including tip contamination.
Troubleshooting for difficulties locating particulate samples.
Introduces Lateral Force Microscopy (LFM) for measuring frictional forces.
Outlines basic operational procedures for Lateral Force Mode.
Steps to set the microscope head configuration.
Instructions for selecting Contact Mode for LFM.
Instructions for head, cantilever, and sample preparation for LFM.
Details how to align the laser for LFM.
Explains how to adjust the photodetector.
Steps to locate and center the tip end of the cantilever.
Instructions for focusing on the sample surface.
Sets initial scan parameters, including scan angle to 90 degrees for LFM.
Provides more detailed information on LFM operation.
Discusses optimal setup for frictional measurements, including scan direction.
Explains how to verify that data obtained in Friction mode is from friction.
Identifies phenomena that produce false features in friction data.
Provides an example of frictional data generated by Scope Mode.
Introduces force plots for measuring tip-sample interactions and determining setpoints.
Uses a magnet analogy to explain force plots and measurements.
Explains how to check cantilever and sample surface interactions in Force Calibration mode.
Shows an example of a Contact Mode AFM force plot using a silicon nitride tip.
Details how control panel windows manipulate the microscope in Force Calibration mode.
Explains parameters for Z scan start, ramp size, data scale, and number of samples.
Describes units selection and X Rotate parameter for indentation.
Explains Data Scale for vertical scaling of deflection signal.
Details deflection and amplitude setpoints for Contact and Tapping Modes.
Discusses triggers for obtaining Force Plot and Force Volume plots.
Describes Capture button and Probe Menu Commands.
Provides steps for obtaining a good force curve in Contact Mode AFM.
Details adjusting Z motion and shifting the graph for a good force curve.
Discusses situations where obtaining a good force curve is difficult.
Covers sensitivity determination and force minimization techniques.
Explains force calibration procedures for Tapping Mode cantilevers.
Describes generating Tapping Mode force plots using silicon calibration references.
Steps to generate a Tapping Mode force plot.
Discusses dangerous conditions of pushing the tip too far into the sample.
Describes plotting phase versus frequency for improved observation of forces.
Describes operation of force modulation mode for imaging local sample stiffness.
Introduces force modulation for imaging composite materials or soft samples.
Discusses selecting a force modulation cantilever based on spring constant.
Explains the principle of force modulation using cantilever oscillation.
Gives instructions for operating in Force Modulation mode.
Discusses artifacts like aliasing and edge effects in force modulation images.
Introduces a new form of force modulation imaging for softer materials.
Steps to find the bimorph resonance frequency.
Procedures for setting interleave controls.
Instructions to obtain a satisfactory Tapping Mode image.
Steps to obtain a negative LiftMode force modulation image.
Combines force measurement and topographic imaging for mapping interaction forces.
Introduces Interleave Scanning as an advanced feature for simultaneous data acquisition.
Discusses applications like MFM and EFM using LiftMode.
Outlines basic operational procedures for Interleave Scanning.
Steps to set the microscope head configuration.
Instructions for selecting Tapping Mode.
Instructions for head, cantilever, and sample preparation for Interleave Scanning.
Details how to align the laser for Interleave Scanning.
Explains how to adjust the photodetector.
Steps to locate and center the tip end of the cantilever.
Instructions for focusing on the sample surface.
Sets initial scan parameters for Interleave Scanning.
Describes the engage command for Interleave Scanning.
Details basic Lift Mode operation for Interleave Scanning.
Outlines basic operational procedures for Lift Mode.
Discusses advanced Lift Mode operations.
Explains how lift scan height affects lateral and vertical resolutions.
Defines tip separation in Lift Mode terms of Z direction.
Recommends setting Line direction to Retrace for interleaved scans.
Covers additional considerations for using Lift Mode with Tapping Mode.
Discusses setting main drive parameters before engaging.
Explains setpoint selection for Tapping Mode in Lift Mode.
Discusses setting interleave drive parameters independently.
Describes performing Magnetic Force Microscopy (MFM) using Interleave and LiftMode.
Explains how MFM scans for topographic and magnetic force information.
Details how frequency shifts are detected for magnetic force gradients.
Discusses amplitude detection techniques for MFM imaging.
Provides instructions for performing basic MFM imaging using LiftMode.
Details instructions for obtaining MFM images using LiftMode.
Outlines the procedure for performing MFM, including probe magnetization.
Discusses advanced MFM operations.
Explains how lift scan height affects MFM imaging resolution.
Describes linear lift for measuring topography.
Discusses setting interleave control parameters.
Explains how drive amplitude affects MFM image quality and signal-to-noise.
Provides instructions for installing the Extender Electronics Module.
Offers troubleshooting advice for MFM imaging.
Checks parameters for obtaining a good MFM gradient image.
Addresses image saturation issues in amplitude detection.
Discusses optical interference in Lift images and how to alleviate it.
Describes performing Electric Force Microscopy (EFM) and Surface Potential imaging.
Introduces EFM and Surface Potential imaging using LiftMode.
Explains how EFM measures variations in electric field gradient.
Describes surface potential imaging by adjusting tip voltage.
Details the theory and procedures for Electric Force Microscopy.
Explains EFM theory based on cantilever resonant frequency changes.
Explains how to apply voltage to the tip or sample, including jumper configurations.
Details procedures for phase, frequency modulation, and amplitude detection.
Covers surface potential measurement using the Extender Electronics Module.
Explains surface potential measurement theory and applied voltage.
Details preparation for applying voltage to the sample or tip.
Provides step-by-step instructions for surface potential imaging.
Describes running Potential in an open-loop configuration for qualitative data.
Provides troubleshooting guidance for Surface Potential feedback loop instability.
Provides detailed instructions for fine calibration and troubleshooting common issues.
Explains the software-guided calibration procedure and theory.
Discusses scanner characteristics and nonlinear relationships for calibration.
Covers checking SPM measuring accuracy and scanner properties.
Describes scanner components and their unique "personalities" measured by sensitivity.
Discusses the use of calibration references for scanner control parameter setup.
Recommends calibrating the scanner for small scan sizes.
Details the procedure for optimizing linearity correction parameters.
Provides a procedure to optimize linearity correction parameters for scanners.
Explains how to calibrate scanners using set parameters in NanoScope software.
Describes the final correction step after capture calibration.
Provides procedures for fine-tuning SPM for maximum X-Y measuring accuracy.
Steps to prepare the system for fine-tuning X-Y calibration.
Measures horizontally at 440V scan size to check accuracy.
Measures vertically at 440V scan size to check accuracy.
Measures horizontally at 150V scan size for fine-tuning.
Measures vertically at 150V scan size for fine-tuning.
Repeats calibration steps with changed scan angle.
Details the procedure for calibrating the Z-axis.
Steps to engage the microscope for Z calibration.
Instructions for capturing and correcting an image for Z calibration.
Measures vertical features using Depth analysis.
Describes how to correct the Z sensitivity parameter.
Steps to recheck Z-axis measuring accuracy.
Details calculating offset deratings for Z-axis calibration.
Covers maintenance procedures and troubleshooting common problems.
Details maintenance procedures for the Dimension SPM.
Procedures for returning components for repair.
Instructions for gently cleaning the cantilever holder.
Periodically cleaning electrical contacts for the holder.
Weekly cleaning of the sample holder and stage surfaces.
Steps for replacing the illuminator light bulb.
Provides a general overview of software main menu items and troubleshooting.
General overview of Real-time menu items.
Explains general operating concepts of Contact Mode AFM.
Addresses common problems encountered in Contact Mode AFM.
Explains general operating concepts of Tapping Mode AFM.
Discusses common problems specific to Tapping Mode AFM.
Procedure to re-initialize the system if Focus Surface or Locate Tip are grayed out.
