Interleave Scanning
14-280 Dimension 3100 Manual Rev. C
14.2 Interleave Scanning
Typical applications of Interleave Scanning include Magnetic Force
Microscopy (MFM) and Electric Force Microscopy (EFM) measurements.
During the interleave scan in Lift Mode™, feedback is disabled and the tip
lifts to a user-selected height above the surface to perform far field
measurements such as MFM and EFM. Topography data recorded during the
main pass keeps the tip a constant distance from the surface during the
interleave trace and retrace. Magnetic and electric forces on the tip result in
cantilever deflection or resonance shifts. A magnetic force or electric force
image is produced by recording these shifts. Lift Mode was developed to
isolate purely MFM and EFM data from topographic data. Chapter 15 provides
detailed instructions for obtaining MFM images of a standard magnetic
sample. Chapter 16 details instructions for obtaining EFM images.
The Interleave commands include a set of Interleave Controls which allow
you to set several scan controls (Drive amplitude, Setpoint, and various
Gains) independently of those in the main scan controls.
14.3 Basic Interleave Scanning Operation
The following is a general outline of basic operational procedures involved in
Interleave Scanning. For more detailed instructions, refer to Chapter 7 of this
manual.
14.3.1 Select the Microscope Head
1. Set the microscope head configuration by selecting the Microscope
/ Select panel from the Di pop-down menu.
2. Click OK to close the Microscope / Select dialog box. When
enabled, the selected buttons are black.
14.3.2 Select Mode of Operation
1. Select Microscope/Profile.
2. Select Tapping Mode as the mode of operation.
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