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Veeco Digital Instruments Dimension 3100 - 8.2 Basic Contact Mode AFM Operation; 8.2.1 Select the Microscope Head; 8.2.2 Select Mode of Operation; 8.2.3 Head, Cantilever and Sample Preparation

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Contact AFM
8-138 Dimension 3100 Manual Rev. C
8.2 Basic Contact Mode AFM Operation
The following is a general outline of basic operational procedures involved in
Contact Mode AFM. For more detailed instructions, refer to Chapter 7 of this
manual.
8.2.1 Select the Microscope Head
1. Set the microscope head configuration by selecting the Microscope
/ Select panel from the Di pop-down menu.
2. Click OK to close the Microscope / Select dialog box. When
enabled, the selected buttons are black.
8.2.2 Select Mode of Operation
1. Select Microscope/Profile.
2. Select Contact Mode as the mode of operation.
8.2.3 Head, Cantilever and Sample Preparation
1. Install a silicon nitride tip onto an AFM cantilever holder (See
Chapter 7).
2. Load the cantilever holder with installed tip onto the scanner tube
of the Dimension SPM head.
8.2.4 Align Laser
1. Align the laser using the laser control knobs.
2. Verify the laser beam is positioned on the back of the cantilever,
with a spot visible in the Dimension head filter screen and a sum
signal of 4-6 volts.

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