analyzer
description, 1-2
analyzer
display
measurement
setup diagram,
3-31
annotations
of display,
1-7
anti-static
mat, 7-36
application
and operation
concepts,
6-1
applications
amplier
testing,
6-145
{148
mixer
testing,
6-149
{160
on-wafer
measurements,
2-76
arrays
exibility,
4-36
format,
6-7
format
,
4-36
raw
data
,
4-36
assign
classes,
5-29
,
5-31
atmospheric
conditions,
7-36
A
TN
(attention)
control
line,
11-17
attention
(A
TN)
control
line,
11-17
attenuation
at
mixer
ports,
3-2
attenuator,
6-2
allowing
repetitive
switching,
6-19
switch
protection,
6-19
NN
N
N
N
N
N
N
N
N
N
N
N
N
N
N
N
N
N
N
N
N
N
NN
NN
N
N
AUTO-FEED
,
4-12
N
N
N
N
N
N
N
N
N
N
N
N
N
N
N
N
N
NN
NN
N
N
N
N
N
N
N
N
AUTO-FEED
use,
4-5
automated
measurements,
6-138
{144
automatic
le
naming
convention
for
LIF
format,
4-19
auto
sweep
time
mode
how to
set,
5-51
auxiliary input
connector location,
1-11
available options,
1-12
averaging, 6-44
changes, 5-56
sweep-to-sweep, 6-5
averaging
factor
how
to
widen,
5-52
4
AV
G
5
key,
6-44
4
AV
G
5
menu
map, 8-2
A
vg
status notation,
1-7
B
4
5
key, 6-10
bandpass mode
fault location measurements, 6-123
reection measurements, 6-119
transmission measurements, 6-121
bandwidth
system:how to widen, 5-52
basic measurement sequence and example,
2-3
basic system maintenance service option,
1-13
basic talker (T6), 11-18
battery
backup for
memory, 12-2
battery
life, 4-33
bias
inputs and
fuses
locations,
1-11
bi-directional
lines, 11-16
blanking
the display,
6-42
broad
band power
meter
calibration
connections,
3-13
bus
device
modes,
11-19
structure,
11-15
,
11-16
C
C10
(pass
control
capabilities),
11-18
C1,C2,C3
(system
controller
capabilities),
11-18
C2
status
notation,
1-7
cabinet,
11-4
cabinet
dimensions,
7-37
cables
HP-IB,
11-5
interconnecting,
5-2
interface,
11-5
test
port
return,
11-2
calculate
statistics
of
the
measurement
data,
2-26
calibrate
menu,
6-73
calibrating
noninsertable devices,
5-39
calibration
concepts,
6-50{101
considerations,
6-65
data
lost, 12-2
device
measurements, 6-65
fast
2-port,
5-54
for
mixer
measurements,
3-6
for
non-insertable
devices,
6-101
for
noninsertable
devices,
5-41
full
two-port,
6-73
in
memory,
12-2
interpolated
error-correction,
6-72
measurement parameters, 6-65
modifying kits, 6-76
omitting isolation, 6-65
one-port, 6-73
power meter, 5-33, 6-95
procedure to modify a user kit, 6-76
receiver, 5-11
response, 6-73
response and isolation, 6-73
restarting, 6-75
saving data, 6-65
specifying kits, 6-75
standard devices, 6-66
standards, 5-6
temperature, 12-5
Index-2
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