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General| Dynamic Range | >100 dB |
|---|---|
| Number of Channels | 2 |
| Display | CRT |
| Resolution Bandwidth (RBW) | 1 Hz to 3 MHz |
| Device Type | Network Analyzer |
| Interface | GPIB |
Lists the chapters and briefly describes their content.
Introduces the HP 8510B/C Option 008 Pulsed-RF measurement capability.
Provides terms and definitions for pulsed-RF network measurements.
Describes how the analyzer measures pulsed-RF S-parameters vs. frequency and time.
Details setup, calibration, and process for pulsed-RF measurements.
Covers calibration and procedures for pulsed-RF S-parameters vs. frequency.
Covers calibration and procedures for pulsed-RF S-parameters vs. time.
Describes internal timing for pulse repetition period and duty cycle capabilities.
Provides guidance on external pulse modulation and triggering.
Discusses considerations for high RF power measurements and system protection.
Shows Option 008 menu structures and key definitions, including programming codes.
Identifies applications and scenarios where pulsed-RF measurements are required.
Explains the system's block diagram, synthesizer usage, and measurement synchronization.
Details the signal separation, routing, and frequency conversion in the test set.
Defines PRP as the time between pulse rising edges.
Defines PRF as the reciprocal of PRP.
Defines Duty Cycle as the ratio of pulse ON time to total PRP.
Defines Pulse Width as the ON time from rising to falling edge.
Defines pulse transition times: rise time (tr) and fall time (tf).
Defines Trigger Delay as the time from pulse ON to measurement.
Defines the time between adjacent Pulse Profile domain data points.
Describes synchronization for measurements at specific points within each pulse at each frequency.
Describes tuning to a single frequency for S-parameter measurement as a function of time during the pulse.
Shows cable connections for the recommended HP 8510B pulse configuration.
Procedure for powering up the system components.
Steps to load configuration files for pulse operation.
Basic tests to check pulsed-RF network analyzer operation.
Steps to check pulse profile domain measurements.
Steps to check frequency domain point-in-pulse measurements.
Procedure to check external triggering for pulsed-RF measurements.
Details calibration steps for point-in-pulse measurements in the frequency domain.
Procedure to set the pulse output polarity (High or Low).
Procedure to set the desired pulse width.
Procedure to set the maximum allowed duty cycle limit.
Procedure to set the trigger delay for measurements.
Instructions for connecting the device under test.
Details calibration methods for pulse profile measurements.
Steps to perform measurement calibration in the pulse profile domain.
Alternative calibration using frequency list for multiple pulse profile frequencies.
Procedure to set the pulse output polarity (High or Low).
Procedure to set the desired pulse width.
Procedure to set the maximum allowed duty cycle limit.
Procedure to set the measurement time span and resolution period.
Procedure to find and adjust the measurement resolution period.
Instructions for connecting the device under test.
Explains how to switch between measurement domains and the implications for cal sets.
Shows the general measurement process flow of the analyzer's measurement cycle.
Details factors affecting measurement cycle time like sweep time and pulse width.
Explains how PRP and duty cycle vary with instrument state and settings.
Explains the relationship between external trigger and stop sweep signals.
Simple setup for controlling PRP/duty cycle with an external pulse generator.
Details maximum power ratings and normal signal levels within the test set.
Instructions for using rear panel links for external equipment.
Setup and procedure for measuring a 30 dB gain amplifier.
Setup and procedure for measuring an amplifier with high input levels.
How to use attenuators to adjust signal levels into mixers.
Steps to set the step attenuators.
Steps to measure user parameters and verify/set attenuator levels.
Discusses effects of changing attenuators/equipment after calibration.
Procedure to store traces for compensating attenuator effects.
How to use stored traces to normalize data for new attenuation levels.
Guidance on choosing calibration methods for high power measurements.
Steps for general calibration and measurement.
Steps for calibration using display math and trace memories.
Steps to create configuration files if system tape is unavailable.
Details new menus created for pulse applications.
Procedure to access the Pulse Configuration menu.
Selects wide bandwidth IF path and detectors.
Selects precision 10 kHz IF path and detectors.
Sets the width of the pulse.
Sets maximum allowed duty cycle for internal triggering.
Selects polarity of TTL Pulse Output to High.
Selects polarity of TTL Pulse Output to Low.
Accesses the Trigger Mode menu.
Sets delay between trigger and measurement in Frequency domain.
Selects internal measurement trigger.
Selects external TTL signal input as the measurement trigger.
Lists programming codes added for Option 008.
Lists query commands added for Option 008.
