HP 8510 User Manual

4
Pulse Measurements Overview
This chapter contains information ab out how the HP 8510 pulsed-RF network analyzer system
measures pulsed-RF S-parameters versus frequency and versus time.
The pulsed-RF conguration allows use of vector network analysis techniques for twotyp es of
measurements:
Pulsed-RF S-Parameters versus Frequency . The measurementissynchronized with the
pulse so that the measurement result is the S-parameter at a specic user-sp ecied p ointin
the pulse at each frequency of the sweep
Pulse Prole . The system is tuned to a single frequency and the measurementis
synchronized with the pulse so that the measurement result is the S-parameter as a function
of time
during the
pulse.
Pulsed-RF
S-parameters
v
ersus
Frequency
Pulsed-RF
tests
in
the
frequency domain
are
accomplished
b
y
sync
hronizing
the
measuremen
t
pro
cess
with
the
pulse
so
that
the
measuremen
t
is
made
at
a
single,
user-sp
ecied
time
during
the
pulse.
A
t
eac
h
frequency
,
the
sources
are
tuned,
the
RF
is turned
on,
then
the
measuremen
t
is
made
after
a
certain
dela
y
.
Figure
4-1
sho
ws
an
example
of this
\frequency
domain
p
oin
t-in-pulse"
measuremen
t
using
the
in
ternal pulse
output and
the
in
ternal
measuremen
t
trigger. F
or in
ternal
trigger
mo
de,
eac
h
data
p
oin
t
of
the
trace
represen
ts
the
resp
onse
of
the
device
to
the
pulsed
stim
ulus
at
the
same
in
terv
al
after
the
pulse is
turned on.
F
or
external
trigger
mo
de,
eac
h
data
p
oin
tof
the trace
represents
the resp
onse
of
the
device
to
the pulsed stimulus after the falling edge of the externally-generated measurementtrigger.
Pulse
Measurements
Ov
erview
4-1

HP 8510 Specifications

General

Dynamic Range	>100 dB
Number of Channels	2
Display	CRT
Resolution Bandwidth (RBW)	1 Hz to 3 MHz
Device Type	Network Analyzer
Interface	GPIB