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General| Brand | HP |
|---|---|
| Model | 83480A |
| Category | Measuring Instruments |
| Language | English |
Details on accessories, options, and part numbers for the instrument.
Explains how to navigate menus and interpret key labels used in the manual.
Describes the layout and functionality of the instrument's front panel controls and display.
Details the connectors and ports located on the back of the instrument.
Explains how to use the Clear Display key to erase waveform data and reset measurements.
Describes how the Fine function enhances the resolution of knob adjustments for better precision.
Details how to access help information for instrument features using the Help key.
Provides specifications for the instrument's horizontal axis, including scale factor and delay.
Lists general operating specifications such as temperature, humidity, and power requirements.
Explains the process of calibrating the instrument's mainframe for accurate performance.
Details how to perform calibration for specific probes connected to the instrument.
Guides through the process of performing eye diagram measurements for signal analysis.
Explains how to verify waveform conformance to predefined standards using mask testing.
Describes how to use the Mask Test menu for analyzing waveform compliance against masks.
Explains the parameters and procedures for performing eye measurements on waveforms.
Covers various trigger modes and settings for capturing specific events.
Introduces the process and parameters for making general waveform measurements on the instrument.
Defines key voltage and timing measurement parameters used by the instrument.
Explains how to measure the period and frequency of waveform signals automatically.
Details measurements for signal edge characteristics like rise time, fall time, and overshoot.
Describes the automatic measurement functions accessible from the instrument's front panel.
Provides methods and considerations for obtaining the highest measurement accuracy from the instrument.
Discusses errors affecting time-interval measurements and how to minimize them.
Explains how to configure data acquisition parameters like averaging and record length.
Details how to set measurement points and customize automatic measurement features.
Covers various trigger modes and settings for capturing specific events.
Describes operations for managing files and data on disk, including directory and file management.
Explains how to control display settings such as persistence, color, and graticule options.
Details how to set up and perform limit tests to compare measurement results against defined criteria.
Covers instrument utilities like HP-IB setup, system configuration, and self-tests.
Lists common instrument messages and provides explanations and troubleshooting steps.
Explains the fundamental principles of sequential sampling used by the instrument.
Provides a block diagram and description of the instrument's hardware components.
Discusses different types of probes and their characteristics for use with the instrument.
Details the available trigger modes, including standard and enhanced bandwidth options.
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