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83480A
HP 83480A User Manual
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Eye
,
M
ask
and
Eyeline
Mode
Measurement
T
utorials
Making
Eyeline
Measurements
(HP
83480A
Option
0
01
only)
Error
trace
capture
Mask
testing
i
s
a
standard
feature
of
the
H
P
8
3480-series
digital
communications
a
nalyzer
.
I
n
a
ddition
t
o
determining
w
hen
mask
violations
occur
,
the
eyeline
application
allows
determination
of
the
b
it
sequence
that
led
t
o
a
mask
violation.
Figure
5-20.
Mask
violation
and
the
sequence
leading
to
the
violation.
5-42
125
127
Table of Contents
General Safety Considerations
4
X-Ray Radiation Notice
7
Typeface Conventions
10
Electrostatic Discharge Information
16
Lightwave Connector Care
19
Cleaning and Handling
21
Storage
23
Making Connections
23
Visual Inspection
25
Optical Performance Testing
25
In this Book
27
Contents
29
Figures List
39
Tables List
42
Product Overview
44
Supplied Accessories
47
Optional Accessories
47
Connection Devices
48
Menu and Key Conventions
49
The Front Panel
51
Autoscale Key
52
Display
53
Front Panel
54
Entry Devices
55
Indicator Lights
56
The Rear Panel
57
General Purpose Keys
62
The Clear Display Key
63
The Fine Function
64
The Help Key
65
The Local Key
66
The Run Key
67
The Stop/Single Key
68
Specifications and Characteristics
70
Horizontal System
71
Trigger Specifications Electrical and Optical Channels
72
Option 100, 12 Ghz Mode
73
Option 100, 12 Ghz/Gate Mod
73
General Speci Fications
74
Calibration Overview
78
Mainframe Calibration
79
Plug-In Module Calibration
81
Skew, Probes, O/E Converters
82
Probe Calibration
83
Eye, Mask and Eyeline Mode Measurement Tutorials
86
Making Eye Diagram Measurements
87
Setting up the System
88
Positioning the Waveform
89
Setting the Trigger
90
Adjusting the Vertical Scale
91
Selecting the Time Base
91
Making the Measurement
93
Measuring Extinction Ratio
94
Marker Lines
94
Measuring Eye Height
97
Measuring Crossing %
98
Measuring Eye Width
99
Measuring Jitter
100
Measuring Duty Cycle Distortion
101
Measuring Q-Factor
103
Measuring Rise Time
105
Measuring Fall Time
107
Testing to a Mask
109
Standard Mask
116
Generating the Mask
117
Verifying Waveform Conformance to the Mask
118
Using Mask Margins
118
Determining the Margin at Failure
120
Making Eyeline Measurements
121
Eyeline Traces
122
Noise Reduction
124
Error Trace Capture
126
Equipment con Guration/Program Installation
127
The Digital Communications Analysis Menus
138
Mask Test Menu
139
Understanding Mask Testing
142
Scale Mask
155
Mask Align
157
Align Mode
158
Run
159
Fail Action
161
Measure Eye Menu
166
Extinction Ratio
168
Eye Height
171
Crossing %
172
Eye Width
174
Jitter
175
Duty Cycle Distortion
176
Q-Factor
177
Channel Setup Menu
179
Time Base Menu
180
Units
181
Bit Rate
181
Scale
182
Position
182
Reference
183
Time Base Windowing
184
Trigger Menu
186
Trigger Basics
186
Sweep
187
Source
187
External Scale
188
Level
188
Slope
188
Hysteresis
189
Trig Bandwidth
189
Waveform Measurements
192
How to Make Waveform Measurements
193
The Waveform Measurement Process
194
Data Collection
195
Building a Histogram
196
Calculating Min and Max from the Data Record
197
Calculating Top and Base
198
Locating Crossing Points
199
Calculating Thresholds
200
Determining Rising and Falling Edges
201
Standard Waveform de Nitions
204
Voltage and Power Measurements
204
Timing de Nitions
207
User-De Ned ∆Time
209
Some Important Measurement Considerations
210
Making Automatic Measurements
212
Period and Frequency Measurements
213
Pulse Width Measurements
214
Rise Time, Fall Time, Preshoot, and Overshoot Measurement
214
Front Panel Measure Section
215
+Width
216
-Width
216
Duty Cycle
216
Fall Time
217
Frequency
217
Overshoot
217
Period
218
Preshoot
218
Rise Time
218
Vamp
219
Vbase
219
Vpp
219
Vrms
220
Vtop
220
General Meas Menu
221
Tmax
222
Tmin
222
Vavg
222
Vlower
223
Vmiddle
223
Vupper
223
Avg Power Menu
224
Freq Domain Menu
225
FFT Freq
225
FFT Meg
225
FFT ∆Freq
226
FFT ∆Mag
226
Peak Number
227
Pk Threshold
228
Histogram Menu
229
Median
231
Peak
231
Pk-Pk
231
Std Dev
232
Increasing Measurement Accuracy and Time-Interval Measurement
234
Increasing Measurement Accuracy
235
Measuring Time Intervals
235
Automatic Measurements
236
Markers
237
Channel-To-Channel Measurements
237
Statistics
237
Jitter and Averaging
240
Time-Interval Measurements
241
DC Errors
241
Vertical Quantization
245
Summary of DC Errors
245
Dynamic Response Errors
246
Rise Time Response
247
General Purpose Oscilloscope Menus
254
Acquisition Menu
255
Averaging
256
Best
257
Record Length
258
Define Measure Menu
260
Thresholds
261
Top-Base
263
Using Markers to Show the Threshold Setting
263
Standard
264
User Defined
265
Using Markers to Show Top-Base Settings
265
Define ∆Time
266
Start Edge or Stop Edge
266
Edge Number
267
Edge Threshold
267
Color Grade
268
Signal Type
268
Eye Window 1 and Eye Window 2
269
Meas Complete
270
Off
271
Mean and Stddev (Standard Deviation)
272
Min, Max
273
FFT Menu
274
Window
276
FFT Scaling
277
Magnify
278
Y-Scale
279
Y-Offset
279
Other FFT Measurements
280
FFT Basics
280
Sine Wave in the Frequency Domain
281
An FFT Display
282
Frequency Measurements
283
Frequency Accuracy
283
Amplitude Measurements
284
Computation of Dbm
285
Computation of Dbv
286
DC Valu
286
Aliasing
287
Presetting FFT Parameters
287
Histograms in the Instrument
289
Mode
292
Axis
292
Histogram Window
293
Histogram Scale
295
Run until
297
Math Menu
298
Function
299
Define Function
299
The General Function Menus
318
Disk Menu
319
Directory
320
Load
322
Store
324
Delete
326
Format
326
Type
327
Partial Listing of the Text Verbose Format for a Normal Waveform
332
Text Verbose Definitions
333
Partial Example of the Text y Values Format
336
Mask Formats
337
Fromt File, to File or File Name
338
To Memory
339
Display Menu
340
Persistence
341
Draw Waveform
343
High Resolution
346
Graticule
347
Label
350
Label Text
352
Modify Label
352
Select Next Label
353
Row
353
Column
353
Color
354
Hue
355
Saturation
355
Luminosity
356
Default Colours
356
Limit Test Menu
357
Test
360
Measurement
360
Fail When
361
Measurement Not Found
362
Upper Limit
363
Lower Limit
363
Store Summary
366
Disk
368
Store Screen
370
Store Waveforms
371
Marker Menu
372
Manual
373
Waveform
375
Histogram
378
Tdr/Tdt
378
Marker Hints
379
Setup Menu
380
Setup Memory
381
Save
381
Recall
382
Default Setup
382
Setup Print Menu
386
Print Format
388
Destiny
390
Select Directory
391
Data
392
TIFF and GIF les on the Apple Macintosh Computer
393
Utility Menu
394
HP-IB Setup
395
System Config
396
Frame
397
Power Statistics
397
Time and Date
398
Plug-In
398
Declassify Frame Memory
399
Update System Firmware
400
Calibrate Plug-In
401
Calibrate Frame
401
Cal Status
402
Self-Test
404
Samplers
404
Firmware Support
405
Service
406
Print Problem Report
406
Waveform Menu
409
Memory Type Waveform
410
Current Memory
410
Memory Scaling
411
From Waveform
411
Pixel
413
Add to Memory
414
Clear Memory
414
Instrument Messages
416
How the Instrument Works
422
Basics of Sequential Sampling
423
System Architecture
428
The Major Plug-In Module Hardware Components
429
The Major Mainframe Hardware Components
430
Probe Selection
432
Probe Loading
433
Reduced Amplitude and DC Offset Caused by Probe Loading
434
Effects of Probe Capacitance
435
System Bandwidth
437
Probe Types
438
Resistive Divider Probes
438
Active Probes
439
Standard and Enhanced Trigger Modes
442
DC-2.5 Ghz Mode
442
DC-100 Mhz Mode
442
2-12 Ghz Mode
443
12 Ghz/Gate Mode
445
Example of Gating
448
Trigger Artifacts
448
Modulus 16 Effect
448
Gate Enable False Triggers
450
Index
454
5
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HP 83480A Specifications
General
Brand
HP
Model
83480A
Category
Measuring Instruments
Language
English
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