HP 8753D - Testing A Device with Limit Lines

Testing
A Device
with Limit
Lines
Limit
testing
is
a
measurement technique
that compares
measurement data
to constraints
that
you
dene
.
Depending
on
the
results of
this comparison,
the analyzer
will indicate
if your
device
either
passes
or
fails
the
test.
Limit
testing
is
implemented
by
creating
individual
at,
sloping, and
single point
limit lines
on
the
analyzer
display
.
When combined,
these lines
can represent
the performance
parameters
for
your
device
under
test.
The
limit lines
created on
each measurement
channel
are
independent
of
each
other
.
This
example
measurement
shows
you
how
to test
a bandpass
lter using
the
following
procedures:
creating
at
limit lines
creating
sloping
limit lines
creating
single
point limit
lines
editing limit
segments
running
a
limit
test
Setting
Up
the
Measurement
P
arameters
1.
Connect
your
test
device
as
shown
in Figure
2-35.
Figure
2-35.
Connections
for
S
A
W
Filter
Example
Measurement
2.
Press
4
PRESET
5
and
choose
the
measurement
settings
.
For
this
example
the
measurement
settings are as follows:
4
MEAS
5
NNNNNNNNNNNNNNN
NNNNNNNNNNNNNNNNNNNNNNNNN
NNNNNNNNNNNNNNNNNNNNNN
Trans: FWD S21 (B/R)
4
CENTER
54
134
54
M/

5
4
SP
AN
54
50
54
M/

5
4
SCALE REF
5
NNNNNNNNNNNNNNNNNNNN
NNNNNNNNNNNN
AUTO SCALE
You may also want to select settings for the number of data points
, power
, averaging, and IF
bandwidth.
3. Substitute a thru for the device and perform a response calibration by pressing:
4
CAL
5
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
CALIBRATE MENU
NNNNNNNNNNNNNNNNNNNNNNNNNN
RESPONSE
NNNNNNNNNNNNNN
THRU
2-36 Making Measurements