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HP 8920A - Page 242

HP 8920A
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242
Chapter 5, Advanced Operations
Increasing Measurement Throughput
3. Frequency Counter Gate Time
The frequency counter’s gate time specifies how long the RF or AF frequency
counter samples the signal before displaying the measured result. Short gate times
measure instantaneous frequency and long gate times measure average frequency.
The longer the gate time, the longer the measurement cycle. The proper gate time
is determined by the measurement requirements. Use the following commands to
set gate times:
For AF frequency measurements, set the AF Analyzer’s gate time with the
AF Cnt Gate field, using the following command:
:AFAN:GTIM <value> MS
For RF frequency measurements, set the RF Analyzer’s gate time with the
RF Cnt Gate field, using the following command:
:RFAN:GTIM <value> MS
4. Number of Active Measurements
The Test Set is capable of making many measurements simultaneously.
Measurements are either in the active state (ON) or in the inactive state (OFF).
When the Test Set receives a trigger event, all active measurements are triggered.
A measurement cycle is complete when all active measurements have obtained a
valid measurement result. To decrease the measurement cycle time, all unused
measurements should be set to the inactive state (turned OFF). Turning OFF
unused measurements will have the greatest impact on reading repetition rate. Use
the STATe command to turn OFF all unneeded measurements on the displayed
screen.

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