5-10 Return to Section Topics 6517B-900-01 Rev. A / Jun 2008
Section 5: Remote Operation Model 6517B Electrometer User’s Manual
:RESistivity Path to configure resistivity
:STHickness <NRf> V
olume: Specify sample thickness; 0.0001 to 99.9999
(mm)
:FSELect <name> Selec
t test fixture (M8009 or USER)
:M8009 Path to qu
ery Model 8009 test fixture:
:RSWitch? Q
uery switch setting (SURFace or VOLume)
:USER Path to configure us
er test fixture
:RSELect <name> Selec
t test type (SURFace or VOLume)
:KSURface <NRf> Sur
face: Specify Ks; 0.001 to 999.999
:KVOLume <NRf> V
olume: Specify Kv; 0.001 to 999.999
:CHARge Path to configu
re Coulombs:
(Volts commands)The same commands as Volts (except
:GUARd)
apply
:ADIScharge Path to contr
ol auto discharge
:LEVel <NRf> Set level (-
2.2e6 to 2.2e6)
[:STATe] <b> En
able or disable auto discharge
V-Source
:SOURce SOURce subsystem
:VOLTage <n> S
pecify V-Source level (0 to ±1000V)
:RANGe <n> Sele
ct range; <100 = 100V range, >100 = 1000V range
:LIMit Path
for voltage limit:
[:AMPLitude] <n> S
pecify voltage limit; 0 to 1000 (V)
:STATe <b> Enable or disable limit
:MCONnect <b> Ena
ble or disable V-Source LO to ammeter LO connection
:CURRent Path for
current limit:
:RLIMit Path to control res
istive current limit:
:STATe <b> Enable or disable res
istive I-limit
:LIMit <b> Path to check
current compliance:
[STATe]? <b> Qu
ery state of current compliance
Data store (Buffer)
:TRACe TRACe subsystem
:ELEMents <name> Sele
ct reading elements :TSTamp, HUMidity, CHANnel,
ETEMperature, VSOurce, NONE
:POINts <n> S
pecify buffer size
:FEED Path to control buf
fer:
:CONTrol <name> Sele
ct control mode and enable buffer: NEVer, NEXT,
ALWays, or PRETrigger
:DATA? Read all readings in buf
fer
Open/close channels and scan
:ROUTe ROUTe subsystem
:CLOSe <list> Close specified
channel
:STATe? Qu
ery the closed channel
:OPEN <list> Op
en specified channel
:OPEN:ALL Op
en all channels
:SCAN Path to contr
ol scanning:
[:INTernal] <list> S
pecify internal scan list: 2 to 10 channels
:EXT
ernal <list> Specify external scan list: 1 to 400 channels
:SMEThod <name> S
pecify settling time for internal card; 0 to 99999.9999 (sec.)
:LSELect <name> En
able the specified scan: INTernal, EXTernal or NONE
Test Equipment Depot - 800.517.8431 - 99 Washington Street Melrose, MA 02176
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