Keithley S530 User Manual

S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual Section 3:
LPTLib command reference
S530-900-01 Rev. E / September 2017 3-9
The maximum number of times data is measured (using the smeasX, sintgX, or savgX command)
is determined by the num_points argument in the asweepX command. A one-dimensional result
array with the same number of data elements as the selected value of the num_points parameter
must be defined in the test program.
When multiple calls to the asweepX command are executed in the same test sequence, the smeasX,
sintgX, or savgX arrays are loaded sequentially. This appends the measurements from the second
asweepX command to the previous results. If the arrays are not dimensioned correctly, access
violations occur. The measurement table remains intact until the devint or clrscn command is
executed.
Defining new test sequences using the smeasX, sintgX, or savgX command appends the command
to the active measure list. Previous measures are still defined and will be used. The clrscn
command is used to eliminate previous buffers for the second sweep. Using the smeasX, sintgX,
and savgX commands after calling the clrscn command causes the appropriate new measures to
be defined and used.

Keithley S530 Specifications

General

Brand	Keithley
Model	S530
Category	Test Equipment
Language	English