Keithley S530

S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual Section 3:
LPTLib command reference
S530-900-01 Rev. E / September 2017 3-35
Example
double idss;
.
.
conpin(GND, 5, 4, 3, 0);
conpin(SMU1, 2, 0);
limiti(SMU1, 2.0E-8); /* Limits to 20.0 nA. */
rangei(SMU1, 2.0E-8); /* Select range for 20.0 nA */
forcev(SMU1, 25.0); /* Apply 25 V to the gate. */
intgi(SMU1, &idss); /* Measure gate leakage; */
/* return results to idss. */
This example measures the relatively low leakage current of a metal-oxide semiconductor field-effect
transistor (MOSFET).
Also see
devint (on page 3-26)
measX (on page 3-45)
rangeX (on page 3-60)
setmode (on page 3-74)