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National Instruments NI PXIe-5653

National Instruments NI PXIe-5653
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NI PXIe-5653 Calibration Procedure | © National Instruments | 13
Fast fourier transform (FFT) mode with Blackman-Harris window
Measurement span from 100 Hz to 10 MHz (offset frequencies)
4. Use the signal source analyzer to perform a manual frequency sweep at the settings in Table 4.
5. Set the RF frequency to 4 GHz and commit the settings to hardware.
6. If your signal source analyzer does not automatically center for phase noise measurements,
manually set the signal source analyzer center frequency to 4 GHz.
7. Check the signal generation status and verify that there are no reported errors or warnings.
8. Use the signal source analyzer to measure the phase noise. Record the results.
9. Close the device session.
10. Ensure that the recorded measurements are within the limits set in Table 5.
Table 4. LO2 Manual Sweep Settings
Carrier Frequency Offset Resolution Bandwidth Cross Correlation
100 Hz to 300 Hz 10 Hz 100
300 Hz to 1 kHz 30 Hz 1,000
1 kHz to 3 kHz 100 Hz 10,000
3 kHz to 10 kHz 300 Hz 10,000
10 kHz to 30 kHz 1 kHz 10,000
30 kHz to 100 kHz 1 kHz 5,000
100 kHz to 300 kHz 3 kHz 1,000
300 kHz to 1 MHz 10 kHz 1,000
1 MHz to 3 MHz 30 kHz 1,000
3 MHz to 10 MHz 100 kHz 1,000
Table 5. LO2 Phase Noise Density (dBc/Hz)
Offset LO2
100 Hz <-92
1 kHz <-121
10 kHz <-134
100 kHz <-134
1 MHz <-143
5 MHz <-155