Rohde & Schwarz URV5-Z4 - RF Probe Accessories; DC Probe URV5-Z1

Voltage Sensors ¸URV5-Z 5
Accessories for RF probe
DC Probe ¸URV5-Z1
The low input capacitance of the DC
Probe ¸URV5-Z1 makes it particularly
suitable for measurements in RF circuits.
Since the probe is virtually non-loaded,
the circuit under test remains largely
unaffected. This prevents the operating
point of active circuits from being shifted,
which can occur with high capacitive
loading.
The DC Probe ¸URV5-Z1, 1 mV to 400 V, 3 pF
÷÷ 9 M :
Accessory Set ¸URV-Z6
20 dB and 40 dB plug-on dividers for extending the voltage measurement range and
reducing the input capacitance to 100 V/1 pF or 1000 V/0.5 pF. BNC adapter for level
measurements in 50 : coaxial lines (see also Insertion Units ¸URV5-Z2/-Z4).
Adapters ¸URV-Z50 and ¸URV-Z3
With integrated termination for power measurements on matched sources, the
adapters make the probe a power sensor with an extremely wide dynamic range of
93 dB. For increasing the measurement accuracy with the 50': adapter connected,
frequency response correction data is stored in each probe.
20/40 dB plug-on dividers and BNC adapter
¸URV-Z50: 50 :, 20 kHz to 1 GHz,
1 nW to 2 W
¸URV-Z3: 75 :, 20 kHz to 500 MHz,
0.5 nW to 1.3 W
Accessories for RF probe
Accessory Set R&S®URV-Zö
20 dB and 40 dB plug-on dividers for extending the voltage measurement range and
reducing the input capacitance to 100 V/l pF or 1000 V/0.5 pF. BNC adapter for level
measurements in 50 Q coaxial lines (see also Insertion Units R&S®URV5-ZZ/—Z4).
Adapters R&S®URV-250 and R&S®URV-Z3
With integrated termination for power measurements on matched sources, the
adapters make the probe a power sensor with an extremely wide dynamic range of
93 dB. For increasing the measurement accuracy with the 50 Q adapter connected,
frequency response correction data is stored in each probe.
20
kHz
to
1
6H2,
.
DC Probe R&S®URV5-Z1
The low input capacitance of the DC
Probe R&S® URV5-Z1 makes it particularly
suitable for measurements in RF circuits.
Since the probe is virtually non-loaded,
the circuit under test remains largely
unaffected. This prevents the operating
point
ofactive
circuits
from
being
shifted,
which can occur with high capacitive
loading.
The at: Probe [me uni/MI, 1 m V to 400 V, 3 pr //9 Mg
Voltage sensors nasounvs-z 5